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Sequence Of Phase Formation In Ni/Ai Contrasted With Ni/Si

Published online by Cambridge University Press:  26 February 2011

E. G. Colgan  and
J. W. Mayer
E. G. Colgan
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
J. W. Mayer
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
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Abstract

We have investigated the interactions of Al/Ni, NiAl3/Ni, and Ni2Al3/Ni thin films between 350 and 500°C. Sequential layer deposition and coevaporation were used to prepare the films which were then vacuum annealed and analyzed by Rutherford backseat tering and X-ray diffraction. Initially, NiAl3 is formed, followed by the more Ni-rich phases. All four intermetallic phases were formed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 54 , 1985 , 121
Copyright
Copyright © Materials Research Society 1986

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References

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