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Sedimentation to Form Rough, Quasi-One-Dimensional Interfaces

Published online by Cambridge University Press:  03 September 2012

James V. Maher
Affiliation:
University of Pittsburgh, Department of Physics and Astronomy, Pittsburgh, PA 15260
M. Levent Kurnaz
Affiliation:
University of Pittsburgh, Department of Physics and Astronomy, Pittsburgh, PA 15260
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Abstract

Sedimentation can result in the growt h of rough interfaces. Although sedimentation has been widely investigated in various areas of geology and engineering, the rough interface aspect of sedimentation is still unstudied. Since hydrodynamic forces are in principle long range, rough interfaces formed through sedimentation provide a significantly different growth situation for comparison with other studies of apparently similar final interfaces. This leads us to the question of the possible existence of universal phenomena in sedimentation and if there are universal phenomena, can one use noise plus a simple growth law to explain them?

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

[1] Bideau, D., private communication.Google Scholar
[2] Amar, J. G. and Family, F., Phys. Rev. E 47, 1595 (1993).Google Scholar
[3] Family, F. and Vicsek, T., J. Phys. A: Math. Gen. 18, 75 (1985).Google Scholar
[4] Family, F., Physica A 168, 561 (1990).Google Scholar
[5] Horvath, V. K., Family, F., and Vicsek, T., Phys. Rev. Lett. 67, 3207 (1991).Google Scholar
[6] Kardar, M., Parisi, G., and Zhang, Y., Phys.Rev.Lett. 56, 889 (1986).Google Scholar
[7] Medina, E., Hwa, T., Kardar, M., and Zhang, Y. C., Phys. Rev. A 39, 3053 (1989).Google Scholar
[8] Amar, J. G., Lam, P. M., and Family, F., Phys. Rev. A 43, 4548 (1991).Google Scholar