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Secondary Ion Mass Spectroscopy of Ceramics

Published online by Cambridge University Press:  22 February 2011

Jenifer A.T. Taylor ,
Paul F. Johnson  and
Vasantha R.W. Amarakoon
Jenifer A.T. Taylor
Affiliation:
New York State College of Ceramics at Alfred Uńiversity, Alfred, NY 14802
Paul F. Johnson
Affiliation:
New York State College of Ceramics at Alfred Uńiversity, Alfred, NY 14802
Vasantha R.W. Amarakoon
Affiliation:
New York State College of Ceramics at Alfred Uńiversity, Alfred, NY 14802
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Abstract

Application of SIMS to ceramics is a complicated but rewarding technique for characterization. The variable composition, hardness and insulating nature of these materials render spectra interpretation complex. Basic data reduction procedures from graphical data collection are presented along with spectra from SIMS applied to a glass frit, magnesium sialon, silicon and PTCR barium titanate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 48: Symposium E – Applied Materials Characterization , 1985 , 281
Copyright
Copyright © Materials Research Society 1985

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References

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