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A Scanning Force Microscopy Study of Block Copolymers Containing a Conjugated Segment
Published online by Cambridge University Press: 10 February 2011
Abstract
Atomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.
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- Copyright © Materials Research Society 1998