Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T09:46:15.578Z Has data issue: false hasContentIssue false

Rf Surface Resistance Measurements in the Pb-Bi-Sr-Ca-Cu-O System

Published online by Cambridge University Press:  28 February 2011

M. T. Lanagan
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
C. L. Bohn
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
J. R. Delayen
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
M. C. Einloth
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
R. N. Vogt
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
U. Balachandran
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

Wires were fabricated from the high-Tc superconductor Bi0.7Pb0.3SrCaCu1.8Ox (Pb-BSCCO) by an extrusion process. The specimens were sintered for periods up to 14 days, and density was found to decrease with longer sintering times. Rf surface resistance data revealed that the onset of superconductivity occurred at 105 K and that the transition was very broad.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Delayen, J. R. and Bohn, C. L., Phys. Rev. B 40, 5151 (1989).Google Scholar
2 Wu, D. H., Kennedy, W. L., Zahopoulos, C., and Sridar, S., Appl. Phys. Lett. 55, 696 (1989).Google Scholar
3 Bohn, C. L., Delayen, J. R., Balachandran, U., and Lanagan, M. T., Appl. Phys. Lett. 55, 304 (1989).Google Scholar
4 Goretta, K. C., Lanagan, M. T., Singh, J. P., Dusek, J. T., Balachandran, U., Dorris, S. E., and Poeppel, R. B., Mater. & Manufact. Process. 4, 163 (1989).Google Scholar
5 Johnson, D. W., Paper (17-SVI-89), presented at 91st Ceram. Soc. Meet., April 23–27, 1989, Indianapolis.Google Scholar
6 Dou, S. X., Liu, H. K., Bourdillon, A. J., Kviz, M., Tan, N. X., and Sorrell, C. C., Phys. Rev. B. 40, 5266 (1989).Google Scholar
7 Shi, D., Boley, M. S., Chen, J. G., Xu, M., Vandervoort, K., Liao, Y. X., Zangvil, A., Akujieze, J., and Segre, C., Appl. Phys. Lett. 55, 699 (1989).Google Scholar