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Resonant X-Ray Fluorescence Spectroscopy at The V L-Edges of Vanadium Oxides

Published online by Cambridge University Press:  10 February 2011

L.-C. Duda ,
C. B. Stagarescu ,
J. E. Downes ,
K. E. Smith  and
G. Dräger
L.-C. Duda
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
C. B. Stagarescu
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
J. E. Downes
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
K. E. Smith
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
G. Dräger
Affiliation:
Fachbereich Physik der Martin-Luther-Universität Halle-Wittenberg, D-06108 Halle, Germany
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Abstract

We have studied resonant V Lα-fluorescence spectra of vanadium oxides with V in several different oxidation states. The spectra are dominated by the O 2p-contribution centered at about 6 eV below the top of the valence band (VB-top). The V 3d-contribution, found close to the VB-top, increases with decreasing valency of the vanadium atoms. Resonant inelastic (Raman) x-ray scattering is fairly weak in these compounds and overlaps with the ordinary fluorescence spectrum. Large spectral changes of V Lα-fluorescence in the metal-insulator transition of V2O3 have been observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 494: Symposium V – Science & Technology of Magnetic Oxides , 1997 , 77
Copyright
Copyright © Materials Research Society 1998

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References

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