Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-19T04:29:22.654Z Has data issue: false hasContentIssue false

Resonant Energy Transfer due to Exciton Coupling in Hybrid Persovskites Conjugated to GaN Semiconductors

Published online by Cambridge University Press:  01 February 2011

Jianyou Li
Affiliation:
[email protected], University of North Texas, Physics, 211 Ave. A, Denton, TX, 76203, United States, 9403698437
Arup Neogi
Affiliation:
University of North Texas, Department of Physics, 211 Ave. A, Denton, TX, 76203, United States
Teruya Ishihara
Affiliation:
[email protected], RIKEN, Wako, 351-0198, Japan
Get access

Abstract

Exciton-Exciton coupling in hybrid persovskites conjugated to GaN Semiconductors system has been studied. Excitons are strongly coupled in (C6H5C2H4NH3)2PbI4[bis(phenethyl-ammonium)tetraiodoplumbatel] (PEPI) is a hybrid inorganic-organic layered, with a perovskite structure quantum well (QW). The inorganic PbI4 monolayer is sandwiched between organic layers. The interaction between electron and hole forming the bound exciton is significantly stronger due to dielectric confinement. The lowest exciton binding energy is 220 meV, which is 20 times in comparison to GaAs. Gallium nitride (GaN) semiconductor has defect bound excitons with absorption band, which overlaps with the emission spectra of the PEPI system. This facilitates resonant energy transfer (RET) from the GaN defect bound exciton states to the excitons confined in the PEPI layer. We investigated the interaction by photoluminescence (PL) and found that 1s exciton in the PEPI layer strongly couples with the GaN defect level exciton, which is pronounced at lower temperature (< ∼ 100 K).

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Achermann, M., Petruska, M. A., Kos, S., Smith, D. L., Koleske, D. D. and Klimov, V. I., Nature, 429, 642 (2004).Google Scholar
2. Shimizu, M. and Ishihara, T., RIKEN Rev., 38, 40 (2001).Google Scholar
3. Ishihara, T., Lumin, J., 60&61, 269 (1994)Google Scholar
4. Mitzi, D. B., Chondroudis, K. and Kagan, C. R., IBM J. Res. & Dev., 45, 29 (2001)Google Scholar
5. Reshchikov, M. A. and Morkoç, H., J. Appl. Phys., 97, 061301 (2005)Google Scholar