Published online by Cambridge University Press: 15 March 2011
For visualization of orientation inhomogeneities in crystalline material orientation imaging maps are conventionally used, with different colors representing different orientations. Two different approaches are proposed to extract more information from the orientation data on deformation structures gathered by electron back-scattering diffraction. First, a statistical approach is introduced for obtaining the chord length distribution of a grain structure and, secondly, an evaluation scheme is presented to resolve the details of the deformation structure within individual grains.