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Reliable InGaAsP/GaAs 40W lasers grown in solid source MBE with phosphorus-cracker

Published online by Cambridge University Press:  15 March 2011

G. K. Kuang
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
I. Hernandez
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
M. McElhinney
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
L. Zeng
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
B. Caliva
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
R. Walker
Affiliation:
Lasertel Inc., 7775 N. Casa Grande Hwy, Tucson, AZ-85743
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Abstract

Laser structures with InGaAsP quantum well were grown on GaAs substrates in a solid source MBE system. Threshold current density Jth as low as 290A/cm2 and slope efficiency as high as 0.68W/A per facet were obtained for uncoated laser chips at 25°C. After 857 hours burn-in at 47A (corresponding to around 47W) at room temperature, power degradation rate was measured to be less than 3×10−6/h.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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References

1. Razeghi, M., Diaz, J., Eliashevich, I., He, X., Yi, H., Erdtman, M., Kolev, E., Wang, L., and Garbuzov, D., 14th IEEE International Semiconductor Laser Conference, 1994, 19-23 Sept. 1994, pp. 159160 Google Scholar
2. Nabiev, R. F., Aarik, J., Asonen, H., Bournes, P., Corvini, P., Fand, F., Finander, M., Jansen, M., Nappi, J., Rakennus, K., Salokatve, A., 16th IEEE International Semiconductor Laser Conference, 1998. ISLC 1998 NARA. 4-8 Oct. 1998, pp. 4344.Google Scholar
3. Sebastian, J., Beister, G., Bugge, F., Buhrandt, F., Erbert, G., Haensel, H. G., Huelsewede, R., Knauer, A., Pittroff, W., Staske, R., Schroeder, M., Wenzel, H., Weyers, M., and Traenkle, G., IEEE J. Selected Topics in Quantum Electronics, 7, 334 (2001)Google Scholar
4. Yellen, S. L., Shepard, A. H., Harding, C. M., Baumann, J. A., Waters, R. G., Garbuzov, D. Z., Pjataev, V., Kochergin, V., and Zory, P. S., IEEE Photonics Technol. Lett., 4, 1328 (1992).Google Scholar
5. Wade, J. K., Mawst, L. J., Botez, D., Nabiev, R. F., Jansen, M., Appl. Phys. Lett., 71, 172 (1997).Google Scholar
6. Bournes, P., Asonen, H., Fang, F., Finander, M., Jansen, M., Nabiev, R. F., Nappi, J., Rakennus, K., Salokatve, A., Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE, 1-4 Dec. 1998, pp: 276277 Google Scholar