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Reliability and Stability of Novel Tunable Thin Film

Published online by Cambridge University Press:  01 February 2011

G. H. Lin ,
R. Fu ,
S. He ,
J. Sun ,
X. Zhang  and
L. Sengupta
G. H. Lin
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
R. Fu
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
S. He
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
J. Sun
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
X. Zhang
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
L. Sengupta
Affiliation:
Paratek Microwave, Inc. 6935 Oakland Mills Road, Columbia, MD 21045, U.S.A.
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Abstract

A new process has been developed in Paratek Microwave Inc. to formulate stable tunable (Ba, Sr)TiO3 (BST) based thin film material. Varactors, with a co-planar structure, were fabricated by using the new material. The varactor Q of 105 tested at 2 GHz was observed with average tunability of 58 % at 150V (37.5 V/μm). The lifetime tests indicated that this material is very stable under continuous 100 to 150 V dc bias both at the room temperature and in 70 °C environment. Thus, this novel tunable thin film material opens a new avenue to develop high quality tunable microwave devices. Tunable IF filters have been built by using this novel material for microwave backhaul radios and handset applications. Initial results of a RF phase shifter are also included and demonstrate another application of these films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 720: Symposium H – Materials Issues for Tunable RF and Microwave Devices III , 2002 , H2.2
Copyright
Copyright © Materials Research Society 2002

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