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The Relationship Between Crystal Structure and Performance as Optical Recording Media In Te-Ge-Sb Thin Films
Published online by Cambridge University Press: 15 February 2011
Abstract
The crystallization properties of Te-Ge and Te-Ge-Sb alloys prepared by thermal evaporation were analyzed using various characterization techniques. Similar to previous results, our data for Te-Ge shows that alloys that deviate slightly from Te50Ge50 stoichiometry show drastically slower crystallization kinetics. Raman spectroscopy and x-ray diffraction show that alloys having non-stoichiometric atomic ratios phase separate during crystallization into a Te50Ge50 phase plus pure crystalline tellurium or germanium. It is this relatively slow process of phase segregation which limits the crystallization rate. Phase segregation during crystallization of non-stoichiometric Te-Ge can be eliminated by adding antimony to samples having a tellurium concentration of from 45 to 55 atomic percent over a wide range of Ge:Sb ratios. These alloys can have laser induced crystallization times of less than 50 nsec. The thermal crystallization temperature is reduced only slightly when antimony is substituted for germanium.
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- Copyright © Materials Research Society 1992
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