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Reflection High Energy Electron Diffraction and Atomic Force Microscopy Studies of MnxSc(1-x) Alloys Grown on MgO(001) Substrates by Molecular Beam Epitaxy

Published online by Cambridge University Press:  10 March 2011

Costel Constantin ,
Abhijit Chinchore  and
Arthur R. Smith
Costel Constantin
Affiliation:
Department of Physics and Astronomy, James Madison University, Harrisonburg, VA 22801
Abhijit Chinchore
Affiliation:
Nanoscale & Quantum Phenomena Institute, Department of Physics and Astronomy, Ohio University, Athens, OH 45701
Arthur R. Smith
Affiliation:
Nanoscale & Quantum Phenomena Institute, Department of Physics and Astronomy, Ohio University, Athens, OH 45701
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Abstract

The combination of the molecular beam epitaxy growth method with the in-situ reflection high energy electron diffraction measurements currently offers unprecedented control of crystalline growth materials. We present here a stoichiometric study of MnxSc(1-x) [x = 0, 0.03, 0.05, 0.15, 0.25, 0.35, and 0.50] thin films grown on MgO(001) substrates with this growth method. Reflection high energy electron diffraction and atomic force microscopy measurements reveal alloy behavior for all of our samples. In addition, we found that samples Mn0.10Sc0.90 and Mn0.50Sc0.50 display surface self-assembled nanowires with a length/width ratio of ~ 800 – 2000.

Keywords

alloymetalSc
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1295: Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , 2011 , mrsf10-1295-n05-37
Copyright
Copyright © Materials Research Society 2011

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References

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