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Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique
Published online by Cambridge University Press: 24 January 2012
Abstract
A setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.
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- Copyright © Materials Research Society 2012
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