Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T04:19:55.841Z Has data issue: false hasContentIssue false

Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique

Published online by Cambridge University Press:  24 January 2012

Urszula Stachewicz
Affiliation:
Nanoforce Technology Ltd., Queen Mary, University of London, Joseph Priestley Building, Mile End Road, London, E1 4NS, U. K.
Fei Hang
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Russell J. Bailey
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Himadri S. Gupta
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Mark D. Frogley
Affiliation:
Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot, OX11 0DE, U.K.
Gianfelice Cinque
Affiliation:
Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot, OX11 0DE, U.K.
Asa H. Barber
Affiliation:
Nanoforce Technology Ltd., Queen Mary, University of London, Joseph Priestley Building, Mile End Road, London, E1 4NS, U. K. School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Get access

Abstract

A setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Wang, W., Bushby, A. J., Barber, A. H., Appl. Phys. Lett. 93 (2008) 201907.Google Scholar
[2] Hang, F., Lu, D., Li, S. W., Barber, A. H., Stress-strain behavior of individual electrospun polymer fibers using combination AFM and SEM, in: M. R. S. S. Proceedings, Probing Mechanics at Nanoscale Dimensions, 1185, 2009, pp. 8791.Google Scholar
[3] Hang, F., Lu, D., Bailey, R. J., Jimenez-Palomar, I., Stachewicz, U., Cortes-Ballesteros, B., Davies, M., Zech, M., Boedefeld, C., Barber, A. H., Nanotechnology 22 (2011).Google Scholar
[4] Wood, J. R., Wagner, H. D., Appl. Phys. Lett. 76 (2000) 28832885.Google Scholar
[5] Reneker, D. H., Chun, I., Nanotechnology 7 (1996) 216223.Google Scholar
[6] Hohman, M. M., Shin, M., Rutledge, G., Brenner, M. P., Phys. Fluids 13 (2001) 22012220.Google Scholar
[7] Stachewicz, U., Barber, A. H., Langmuir 27 (2011) 30243029.Google Scholar