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Real-time optical monitoring of gas phase dynamics for the growth of InN at elevated pressures

Published online by Cambridge University Press:  01 February 2011

N. Dietz ,
H. Born ,
M. Strassburg  and
V. Woods
N. Dietz
Affiliation:
Department of Physics & Astronomy, Georgia State University, AtlantaGA 30303
H. Born
Affiliation:
Department of Physics & Astronomy, Georgia State University, AtlantaGA 30303
M. Strassburg
Affiliation:
Department of Physics & Astronomy, Georgia State University, AtlantaGA 30303
V. Woods
Affiliation:
Department of Physics & Astronomy, Georgia State University, AtlantaGA 30303
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Abstract

The request for increased performance in high-power / high-frequency optoelectronic devices requires new methods for the fabrication of high quality III nitride alloys that exhibit large thermal decomposition pressure such as InN and related materials. To extend the process and growth window towards elevated pressures, a high-pressure CVD system with integrated real time optical characterization techniques has been constructed. The built-in real-time monitoring techniques allow the characterization of gas flow dynamics, precursor decomposition kinetics, as well as the monitoring of the crucial steps of nucleation and film formation. The gas flow dynamics has been characterized and the process parameter are obtained under which the thin film growth process can be maintained under laminar flow condition. Laser light scattering (LLS) has been proven as the most robust optical tool to characterize the onset of turbulence.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 798: Symposium Y – GaN and Related Alloys , 2003 , Y10.45
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

[1] Amano, H., Akasaki, I., Hiramatsu, K., Koide, N., Sawaki, N., Thin Solid Films 163, 415 (1988).Google Scholar
[2] Nakamura, S., Jpn. J. Appl. Phys. 30, L1705 (1991).Google Scholar
[3] Sasaki, T., Matsuoka, T., J. Appl. Phys. 77(1), p. 192 (1995).Google Scholar
[4] Davydov, V. Yu., Klochikhin, A.A., Emtsev, V.V., Kurdyukov, D.A., Ivanov, S.V., Vekshin, V.A., Bechstedt, F., Furthmüller, J., Aderhold, J., Graul, J., Mudryi, A.V., Harima, H., Hashimoto, A., Yamamoto, A., Haller, E.E., Physica Status Solidi B, 234(3) 787–795 (2002).Google Scholar
[5] Yang, Fuh-Hsiang, Hwang, Jih-Shang, Chen, Kuei-Hsien, Yang, Ying-Jay, Tzung-Han, Lee, Hwa, Luu-Gen and Chen, Li-Chyong, Thin Solid Films, 405(1–2), 194–197 (2002).Google Scholar
[6] Malakhov, V.Ya., Solar Energy Materials and Solar Cells, 76(4), 637–646 (2003).Google Scholar
[7] Matsuoka, T., Okamoto, H., Nakao, M., Harima, H., Kurimoto, E., Appl. Phys. Lett. 81(7), 1246–1248 (2002).Google Scholar
[8] McChesney, J.B., Bridenbaugh, P.M. and O'Connor, P.B., Mater. Res. Bull. 5, 783 (1970).Google Scholar
[9] Dietz, N., McCall, S., Bachmann, K.J., Proceedings of the Microgravity Conference 2000, Huntsville AL. June 6–8, NASA/CP-2001–210827, 176 –181 (2001).Google Scholar
[10] McCall, S. D. and Bachmann, K. J., Mat. Res. Soc. Symp. Proc. Vol. 693, I3.13.1–8 (2002).Google Scholar
[11] Cardelino, B. H., Moore, C. E., Cardelino, C. A., McCall, S. D., Frazier, D. O., Bachmann, K. J.; Physical, J. Chemistry A 107, 3708–3718 (2003).Google Scholar
[12] Dietz, N., Woods, V., McCall, S. and Bachmann, K.J., Proceedings of the Microgravity Conference 2002, NASA/CP-2003–212339, 169–181 (2003).Google Scholar
[13] Landau, L. D. and Lifshitz, E. M., “Fluid Mechanics”, ISBN: 0750627670, Butterworth-Heinemann; 2nd ed. (1987).Google Scholar