Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Duncan, W.M.
Henck, S.A.
and
Loewenstein, L.M.
1992.
Spectral Ellipsometry for In Situ Real-Time Measurement and Control.
p.
117.
Johs, Blaine
Doerr, David
Pittal, Shakil
Woollan, John A.
Bhat, Ishwara
and
Dakshinamurthy, S.
1993.
Hardware and software for in-situ process monitor and control using multiple wavelength ellipsometry.
Surface and Coatings Technology,
Vol. 62,
Issue. 1-3,
p.
680.
Duncan, Walter M.
and
Henck, Steven A.
1993.
Semiconductor Materials Analysis and Fabrication Process Control.
p.
9.
Woollam, John A.
Johs, Blaine
McGahan, William A.
Snyder, Paul G.
Hale, Jeffrey
and
Yao, Huade Walter
1993.
In situ and Ex situ Applications of Spectroscopic Ellipsometry.
MRS Proceedings,
Vol. 324,
Issue. ,
Aspnes, D. E.
1993.
Real-Time Surface and Near-Surface Optical Diagnostics for Epitaxial Growth.
MRS Proceedings,
Vol. 324,
Issue. ,
Duncan, Walter M.
and
Henck, Steven A.
1993.
Insitu spectral ellipsometry for real-time measurement and control.
Applied Surface Science,
Vol. 63,
Issue. 1-4,
p.
9.
Celii, F.G.
Moise, T.S.
Yung-Chung Kao
and
Katz, A.J.
1995.
Optical diagnostic monitoring of resonant-tunneling diode growth.
IEEE Journal of Selected Topics in Quantum Electronics,
Vol. 1,
Issue. 4,
p.
1064.
PICKERING, C.
1995.
Photonic Probes of Surfaces.
p.
1.
Johs, Blaine
Hale, Jeff
and
Hilfiker, James
1997.
Real-time process control with in situ spectroscopic ellipsometry.
III-Vs Review,
Vol. 10,
Issue. 5,
p.
40.
Hilfiker, J.N.
2011.
In Situ Characterization of Thin Film Growth.
p.
99.