Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-29T07:30:24.014Z Has data issue: false hasContentIssue false

Realization of SiO2-B2O3-TiO2 Waveguides and Reflectors on Si Substrates

Published online by Cambridge University Press:  15 February 2011

Hartmut W. Schneider*
Affiliation:
Siemens AG, Corporate Research and Development, W-8000 Munich, Germany
Get access

Abstract

TiO2-B2O3 doped silica single-mode waveguide arrays on silicon substrates were fabricated by flame hydrolysis soot deposition, glass consolidation and etching. CHF3 reactive ion etching is suitable for more than 15 μm deep vertical gap and reflector preparation. Minimum waveguide propagation loss values of (0.21±0.01) dB/cm were measured on 50 mm single-mode samples. Spectral measurements proved the absence OH absorption in the 850 to 1600 nm range and indicate scattering as the most important loss effect.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kawachi, M., Opt. Quant. Electron. 22, 391 (1990)10.1007/BF02113964Google Scholar
2. Henry, C. H., Blonder, G. E.. and Kazarinov, R. F., J. Lightwave Technol. 7, 1530 (1989)10.1109/50.39094Google Scholar
3. Valette, S., Renard, S., Denis, H., Jadot, J. P., Founier, A., Philippe, P., Gidon, P., Grouillet, A. M., and Desgranges, E., Solid State Technol. 32. 69 (1989)Google Scholar
4. Karstensen, H., Schneider, H. W., Staudt, A., Zarschizky, H., Gerndt, C., Klement, E., and Tischer, H. in Optical Interconnections and Networks. edited by Bartelt, H. (SPIE Vol.1281, Bellingham, Washington, 1990) pp. 2332 Google Scholar
5. März, R. and Cremer, C., submitted to J. Lightwave Technol.Google Scholar
6. Schultz, P. C., J. Amer. Ceram. Soc. 59 214 (1976)10.1111/j.1151-2916.1976.tb10936.xGoogle Scholar
7. Flamm, D. L., in Plasma Etching. edited by Manos, D. M. and Flamm, D. L. (Academic Press, Boston, 1990) p. 159 Google Scholar
8. Tsou, L. Y., J. Electrochem. Soc. 136. 3003 (1989)10.1149/1.2096391Google Scholar
9. Kominato, T., Ohmori, Y., Okazaki, H., and Yasu, M., Electron. Lett. 26 327 (1990)Google Scholar