Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-27T01:59:33.910Z Has data issue: false hasContentIssue false

Read-Shockley Boundaries in Thin Films

Published online by Cambridge University Press:  10 February 2011

Alexander H. King*
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794–2275, U. S. A.
Get access

Abstract

When a grain boundary is terminated by a free surface, its behavior may be significantly different than for the same boundary either in an infinite bicrystal, or terminated by triple junctions. In this paper we describe some phenomena related to the free-surface interactions of interfacial dislocations, in thin films. We show that surface relaxation stresses can exert a powerful destabilizing influence upon the dislocation structure of many grain boundaries, and that they can only be made stable if a large lattice friction stress, or other pinning force, resists the motion of the dislocations. Finally, we will show that the only intrinsically stable grain boundary in a thin film is a tilt boundary with its rotation axis parallel to the normal of the film.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Read, W.T. and Shockley, W.: Phys. Rev. 78 (1950) 275.Google Scholar
2. Balasubramanian, L. and King, A.H. in Defect Interface Interactions eds. Kvam, E.P., King, A.H., Mills, M.J., Sands, T.D. and Vitek, V., MRS Symp. Ser. 319 (1994) 245.Google Scholar
3. Sautter, H., Gleiter, H. and Bäro, G.: Acta Metall. 25 (1977) 467.Google Scholar
4. Hirth, J.P. and Lothe, J., Theory of Dislocations, 2nd Ed., Wiley, New York, (1982).Google Scholar
5. Chan, S.W. and Balluffi, R.W., Acta Metall. 33 (1985) 1113.Google Scholar
6. Chan, S.W. and Boyko, V.S.: Phys. Rev. B 53 (1996) 16579.Google Scholar
7. Harris, K.E. and King, A.H. in Thin Films: Stresses and Mechanical Properties V eds. Baker, S.P., Ross, C.A., Townsend, P.H., Volkert, C.A. and Børgesen, P. MRS Symp. Ser. 356 (1995) 75.Google Scholar
8. Hazzledine, P.M.: unpublished work cited in Electron Microscopy of Thin Crystals by Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M.J., Krieger, New York (1976).Google Scholar