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Rapid Depth-Resolved Analysis of Nitride Layers (>50 Micrometers) on Prosthetic Devices by Radio Frequency Glow Discharge Atomic Emission Spectroscopy

Published online by Cambridge University Press:  15 February 2011

R. Kenneth ,
Matthew L. Hartenstein ,
Richard Compton  and
Ravi Shetty
R. Kenneth
Affiliation:
Department of Chemistry, Clemson University, Clemson, SC 29634, [email protected]
Matthew L. Hartenstein
Affiliation:
Department of Chemistry, Clemson University, Clemson, SC 29634, [email protected]
Richard Compton
Affiliation:
Zimmer Inc., Boggs Industrial Park, PO Box 708, Warsaw, IN 46581-0708
Ravi Shetty
Affiliation:
Zimmer Inc., Boggs Industrial Park, PO Box 708, Warsaw, IN 46581-0708
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Abstract

The ability to provide depth-resolved chemical information is an important attribute for analytical methods employed in the biomaterials laboratory, both research and production. Radio frequency glow discharge atomic emission spectroscopy (rf-GD-AES) is shown to provide profiles of nitrogen content in prosthetic alloys to depths of greater than 50 micrometers, with analysis times of less than 30 minutes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 550: Symposium GG/HH/II – Biomedical Materials-Drug Delivery, Implants and Tissue Engr , 1998 , 343
Copyright
Copyright © Materials Research Society 1999

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