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Rapid Crystallization of Amorphous Silicon Utilizing the Plasma Annealing at Atmospheric Pressure
Published online by Cambridge University Press: 01 February 2011
Abstract
The rapid crystallization of amorphous silicon utilizing the rf inductive coupling thermal plasma jet of argon is demonstrated. Highly crystallized a-Si films were fabricated on th-SiO2 and textured a-Si:H:B/SnO2/glass by adjusting the translational velocity of the substrate stage. The H concentration in the films decreased from 1021 cm-3 to 1019 cm-3 with no marked increases in oxygen and nitrogen impurity concentrations and defect density. The crystallization proceeds from the bottom to front surface in terms of the volume expansion during the solidification and crystallization of liquid Si.
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- Copyright © Materials Research Society 2007
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