Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T23:34:17.178Z Has data issue: false hasContentIssue false

Radiation Induced Cavity Formation and Gold Precipitation at the Interfaces of a ZrO2/SiO2/Si Heterostructure

Published online by Cambridge University Press:  03 March 2011

Philip D Edmondson*
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
Chongmin Wang
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, U.S.A.
Zihua Zhu
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, U.S.A.
Fereydoon Namavar
Affiliation:
University of Nebraska Medical Center Omaha, NE 68198, U.S.A.
William J Weber
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37831, U.S.A.
Yanwen Zhang
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37831, U.S.A.
*
Contact author: [email protected]
Get access

Abstract

Thin films nano-crystalline zirconia of ~ 300 nm thick were deposited on Si substrate, and the samples were irradiated with 2 MeV Au+ ions at temperatures of 160 and 400 K, up to fluences of 35 displacements per atom. The films were then studied using glancing incidence x-ray diffraction, Rutherford backscattering, secondary ion mass spectroscopy and transmission electron microscopy. During the irradiation, cavities were observed to form at the zirconia/silicon interface. The morphology of the cavities was found to be related to the damage state of the underlying Si substrate. Elongated cavities were observed when the substrate is heavily damaged but not amorphized; however, when the substrate is rendered amorphous, the cavities become spherical. As the ion dose increases, the cavities then act as efficient gettering sites for the Au. The concentration of oxygen within the cavities determines the order in which the cavities getter. Following complete filling of the cavities, the interface acts as the secondary gettering site for the Au. The Au precipitates are determined to be elemental in nature due to the high binding free energy for the formation of Au-silicides.

Type
Articles
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Copel, M., Gribelyuk, M., and Gusev, E., Applied Physics Letters, 76 (2000) 436–438.Google Scholar
2. Gong, W.L., Lutze, W., and Ewing, R.C., Journal of Nuclear Materials, 277 (2000) 239–249.Google Scholar
3. Wilk, G.D., Wallace, R.M., and Anthony, J.M., Journal of Applied Physics, 87 (2000) 484–492.Google Scholar
4. Zhu, L.Q., Zhang, L.D., Li, G.H., He, G., Liu, M., and Fang, Q., Applied Physics Letters, 88 (2006) 232901–3.Google Scholar
5. Simeone, D., Baldinozzi, G., Gosset, D., LeCaër, S., and Mazerolles, L., Physical Review B, 70 (2004) 134116.Google Scholar
6. Kovalenko, M.V., Scheele, M., and Talapin, D.V., Science, 324 (2009) 1417–1420.Google Scholar
7. Lian, J., Zhang, J., Namavar, F., Zhang, Y., Lu, F., Haider, H., Garvin, K., Weber, W.J., and Ewing, R.C., Nanotechnology, 20 (2009) 245303.Google Scholar
8. Norris, D.J., Efros, A.L., and Erwin, S.C., Science, 319 (2008) 1776–1779.Google Scholar
9. Zhang, Y., Jiang, W., Wang, C., Namavar, F., Edmondson, P.D., Zhu, Z., Gao, F., Lian, J., and Weber, W.J., Physical Review B, 82 (2010) 184105.Google Scholar
10. Namavar, F., Cheung, C.L., Sabirianov, R.F., Mei, W.-N., Zeng, X.C., Wang, G., Haider, H., and Garvin, K.L., Nano Letters, 8 (2008) 988–996.Google Scholar
11. Edmondson, P.D., Zhang, Y., Namavar, F., Wang, C.M., Zhu, Z., and Weber, W.J., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269 (2011) 126–132.Google Scholar
12. Devanathan, R., Weber, W.J., Singhal, S.C., and Gale, J.D., Solid State Ionics, 177 (2006) 1251–1258.Google Scholar
13. Brossmann, U., Wurschum, R., Sodervall, U., and Schaefer, H.-E., Journal of Applied Physics, 85 (1999) 7646–7654.Google Scholar
14. Knöner, G., Reimann, K., Röwer, R., Södervall, U., and Schaefer, H.-E., Proceedings of the National Academy of Sciences of the United States of America, 100 (2003) 3870–3873.Google Scholar
15. Hu, S.M., Applied Physics Letters, 48 (1986) 115–117.Google Scholar
16. Brett, D.A., Llewellyn, D.J., and Ridgway, M.C., Applied Physics Letters, 88 (2006) 222107–3.Google Scholar
17. Myers, S.M., Petersen, G.A., and Seager, C.H., Journal of Applied Physics, 80 (1996) 3717–3726.Google Scholar
18. Williams, J.S., Conway, M.J., Wong-Leung, J., Deenapanray, P.N.K., Petravic, M., Brown, R.A., Eaglesham, D.J., and Jacobson, D.C., Applied Physics Letters, 75 (1999) 2424–2426.Google Scholar