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A Quantitative Crystallization Study of Thin Amorphous Fe80B20 Films Via Empirical Modeling of Exafs Data

Published online by Cambridge University Press:  15 February 2011

V. G. Harris ,
S. A. Oliver ,
J. D. Ayers ,
B. N. Das  and
N. C. Koon
V. G. Harris
Affiliation:
U.S. Naval Research Laboratory, Washington, D.C. 20375-5000
S. A. Oliver
Affiliation:
Center for Electromagnetics Research. Northeastern University, Boston, MA 02115
J. D. Ayers
Affiliation:
U.S. Naval Research Laboratory, Washington, D.C. 20375-5000
B. N. Das
Affiliation:
U.S. Naval Research Laboratory, Washington, D.C. 20375-5000
N. C. Koon
Affiliation:
U.S. Naval Research Laboratory, Washington, D.C. 20375-5000
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Abstract

Thin amorphous films (t=200Å) of Fe80B20 were annealed at temperatures ranging from 473K–823K and studied using extended X-ray absorption fine structure to investigate the evolution of local structure around the Fe atoms during crystallization. Modeling of the local environment around Fe using empirical standards was employed to determine the relative fraction of the crystalline phases present in annealed samples. Results illustrate the sensitivity of EXAFS in detecting the onset of crystallization in thin amorphous films and its ability to quantitatively measure the relative fraction of crystalline phases present in partially crystallized thin film samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 9
Copyright
Copyright © Materials Research Society 1995

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References

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