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Quantification of Trace and Ultra-trace Elements in Nuclear Grade Manufactured Graphites by Fast-Flow Glow Discharge Mass Spectrometry and by Inductively Coupled Plasma – Mass Spectrometry after Microwave – Induced Combustion Digestions

Published online by Cambridge University Press:  31 January 2011

Xinwei Wang ,
Gaurav Bhagat ,
Kevin Michael O'Brien  and
Karol Putyera
Xinwei Wang
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Gaurav Bhagat
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Kevin Michael O'Brien
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Karol Putyera
Affiliation:
[email protected]@eaglabs.com, EAG-NY, Shiva Technologies, 6707 Brooklawn parkway, Syracuse, New York, 13211, United States, 3154319900, 3154319800
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Abstract

FF-GDMS and MIC-ICP-MS methods were developed for the determination of mg/kg- and μg/kg-level B, Mg, Al, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Mo, Sb, W and Pb in nuclear-grade graphite. Consistent results have been achieved in determining trace elements like B, Ti, Cr, Mn, Zr, Sb and Pb by both methods, which vary mostly less than ±30%, and are in line with the manufacturer reference values. On Mg, Al, Fe, Co, Zn, Mo and W, FF-GDMS analyses also show good agreement with the manufacturer's data. Continuing efforts in identifying source of interference, which has limited the MIC-ICP-MS analysis of these elements, is currently underway.

Keywords

mass spectroscopynuclear materialschemical composition
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1215: Symposium V – Materials Research Needs to Advance Nuclear Energy , 2009 , 1215-V16-09
Copyright
Copyright © Materials Research Society 2010

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References

(1) Bonal, J.-P.; Kohyama, A.; van der Laan, J.; Snead, L. L. In MRS Bulletin, 2009.Google Scholar
(2) Shibata, T.; Sumita, J.; Tada, T.; Hanawa, S.; Sawa, K.; Iyoku, T. J. Nucl. Mat. 2008, 381, 165.Google Scholar
(3) Virgilev, Y. S. Atomic Energy 1998, 84.Google Scholar
(4) Contescu, C.; Azad, S.; Miller, D.; Lance, M. J.; Baker, F. S.; Burchell, T. J. Nucl. Mat. 2008, 381, 15.Google Scholar
(5) Franzen, P.; Haasz, A. A.; Davis, J. W. J. Nucl. Mat. 1995, 226, 15.Google Scholar
(6) Bolewski, A. Jr.; Ciechanowski, M.; Dydejczyk, A.; Kreft, A. Nucl. Instr. and Meth. in Phys. Res. B 2005, 237, 602.Google Scholar
(7) Delle, W.; Koizlik, K.; Nickel, H. “Graphitische Werkstoffe fur den Enisatz in Kernreaktoren”, Ed. Karl Thiemig, A.G., pp 55–56, Munich, 1983.Google Scholar
(8) Bogershausen, W.; Cicciarelli, R.; Gercken, B.; Konig, E.; Krivan, V.; Muller-Kafer, R.; Pavel, J.; Seltner, H.; Schelcher, J. Fresenius J. Anal. Chem. 1997, 357, 266.Google Scholar
(9) Schaffer, U.; Krivan, V. Anal. Chem. 1999, 71, 849.Google Scholar
(10) Pickhardt, C.; Becker, J. S. Fresenius J. Anal. Chem. 2001, 370, 534.Google Scholar
(11) Schaffer, U.; Krivan, V. Fresenius J. Anal. Chem. 2001, 371, 859.Google Scholar
(12) Braun, T.; Rausch, H. Anal. Chem. 1995, 67, 1517.Google Scholar
(13) Mahantl, H. S.; Barnes, R. M. Anal. Chem. 1983, 55, 403.Google Scholar
(14) Michellon, C.; Putyera, K.; Kasik, M.; Hockett, R. “Production Support and Process Control of PV Materials by Direct Sampling High Resolution Glow Discharge Mass Spectrometry Methods”, Application Notes PA117, Evans Analytic Group LLC, 2008.Google Scholar
(15) Putyera, K.; Su, K.; Liu, C.; Hockett, R. S.; Wang, L. 2008 Fall MRS Proceedings - Photovoltaic Materials and Manufacturing Issues, Vol. 1123, Paper#1123-P01-08, Dec 1-5 2008, Boston MA.Google Scholar
(16) Spitsberg, I. T.; Putyera, K. Surf. & Coatings Techn. 2001, 139, 35.Google Scholar
(17) Flores, E. M. M.; Barin, J. S.; Mesko, M. F.; Knapp, G. Spectrochimica Acta Part B 2007, 62, 1051.Google Scholar