Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-17T17:20:19.291Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantification of Light Trapping Using a Reciprocity Between Electroluminescent Emission and Photovoltaic Action in a Solar Cell

Published online by Cambridge University Press:  01 February 2011

Thomas Kirchartz ,
Anke Helbig  and
Uwe Rau
Thomas Kirchartz
Affiliation:
[email protected], Forschungszentrum Jülich, IEF5 Photovoltaik, Leo Brandt Str., Jülich, 52425, Germany
Anke Helbig
Affiliation:
[email protected], Universität Stuttgart, Institut für Physikalische Elektronik, Stuttgart, 70569, Germany
Uwe Rau
Affiliation:
[email protected], Forschungszentrum Jülich, IEF5 Photovoltaik, Leo Brandt Str., Jülich, 52425, Germany
Get access

Abstract

Spatially and spectrally resolved electroluminescence (EL) measurements are powerful methods to characterize solar cells, if the EL is properly interpreted. The task of interpreting the results and modeling the spectral and absolute EL emission is strongly simplified by considering the link between EL and quantum efficiency. Using this connection, we show how to quantify the influence of light trapping on the solar cell absorptance using EL.

Keywords

Siluminescencephotovoltaic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1101: Symposium KK – Light Management in Photovoltaic Devices–Theory and Practice , 2008 , 1101-KK01-04
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Trupke, T. Bardos, R. Schubert, M. C. and Warta, W. Appl. Phys. Lett. 89, 044107 (2006)10.1063/1.2234747Google Scholar
2 Fuyuki, T. Kondo, H. Yamazaki, T. Takahashi, Y. and Uraoka, Y. Appl. Phys. Lett. 86 262108 (2005)10.1063/1.1978979Google Scholar
3 Rau, U. Phys. Rev. B 76, 085303 (2007).10.1103/PhysRevB.76.085303Google Scholar
4 Kirchartz, T. Rau, U. Kurth, M. Mattheis, J. and Werner, J. H. Thin Solid Films 515, 6238 (2007).Google Scholar
5 Kirchartz, T. and Rau, U. J. Appl. Phys. 102, 104510 (2007).Google Scholar
6 Würfel, P., Trupke, T. Puzzer, T. Schäffer, E., Warta, W. Glunz, S. W. J. Appl. Phys. 101, 123110 (2007).Google Scholar
7 Ramspeck, K. Bothe, K. Hinken, D. Fischer, B. Schmidt, J. and Brendel, R. Appl. Phys. Lett. 90, 153502 (2007).Google Scholar
8 Hinken, D. Ramspeck, K. Bothe, K. Fischer, B. and Brendel, R. Appl. Phys. Lett. 91, 182104 (2007).Google Scholar
9 Kasemann, M. Schubert, M. C. The, M. Köber, M., Hermle, M. and Warta, W. Appl. Phys. Lett. 89, 224102 (2006).Google Scholar
10 Würfel, P., J. Phys. C: Solid State Phys. 15, 3967 (1982).Google Scholar
11 Donolato, C. Appl. Phys. Lett. 46, 270 (1985).Google Scholar
12 Daub, E. and Würfel, P.. Phys. Rev. Lett. 74, 1020 (1995).10.1103/PhysRevLett.74.1020Google Scholar
13 Yablonovitch, E.. J. Opt. Soc. Am. 72, 899 (1982).Google Scholar
14 Mattheis, J. Werner, J. H. Rau, U. Phys. Rev. B. 77, 085203 (2008).Google Scholar
15 Mattheis, J. PhD Thesis, (University of Stuttgart, 2008), p. 143.Google Scholar