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Pyroelectric Properties of Ferroelectric Thin Films: Effect of Internal Stresses

Published online by Cambridge University Press:  01 February 2011

A. Sharma ,
Z.–G. Ban  and
S. P. Alpay
A. Sharma
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
Z.–G. Ban
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
S. P. Alpay
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
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Abstract

A thermodynamic model is employed to analyze the effect of internal stresses on the pyroelectric response of ferroelectric thin films. The pyroelectric coefficient as a function of the misfit strain is calculated for (001) Ba0.6Sr0.4TiO3 epitaxial thin films by taking into account formation of misfit dislocations that relieve epitaxial stresses during deposition. It is shown that the pyroelectric response is highly dependent on the misfit strain in epitaxial thin films. Enhanced pyroelectric coefficient can be achieved by adjusting the misfit strain via substrate selection and film thickness especially in the vicinity of the ferroelectric to paraelectric phase transformation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 784: Symposium C – Ferroelectric Thin Films XII , 2003 , C10.9
Copyright
Copyright © Materials Research Society 2004

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References

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