Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T01:42:59.137Z Has data issue: false hasContentIssue false
  • English
  • Français

Pulsed–Raman Measurements of Temperature When Large Temperature Variations and Gradients are Present*

Published online by Cambridge University Press:  15 February 2011

R. F. Wood ,
M. Rasolt  and
G. E. Jellison Jr.
R. F. Wood
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN
M. Rasolt
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN
G. E. Jellison Jr.
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN
Get access

Abstract

Pulsed Raman temperature measurements by Lo and Compaan on Si samples have been interpreted as proving that the surface region does not melt during intense pulsed laser irradiation. In this paper, it is shown by detailed calculations with the melting model that the choice of experimental parameters in the Raman measurements can severely compromise a straightforward interpretation of the data. Moreover, it is demonstrated that temperatures extracted from Raman measurements are highly sensitive to the temperature-dependent optical properties of the material. Finally, it is pointed out that the very large temperature gradients present during pulsed laser annealing may entirely invalidate the Stokes/anti-Stokes ratio as an accurate temperature probe.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 4: Symposium A – Laser and Electron-Beam Interactions with Solids , 1981 , 61
Copyright
Copyright © Materials Research Society 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

Research sponsored by the Division of Materials Science, U.S. Department of Energy, under contract W–7405–eng–26 with Union Carbide Corporation.

References

REFERENCES

1. Numerous references to experimental and theoretical work related to the melting model are given in Wood, R. F. and Giles, G. E., Phys. Rev. B 23, (1981);Google Scholar
Wood, R. F., Kirkpatrick, J. R. and Giles, G. E., Phys. Rev. B 23, (1981);Google Scholar
Wood, R. F., Phys. Rev. B (in press).Google Scholar
2. Lo, H. W. and Compaan, A., Phys. Rev. Lett. 44, 1604 (1980).CrossRefGoogle Scholar
3. Lo, H. W. and Compaan, A., Appl. Phys. Lett. 38, 179 (1980).Google Scholar
4. Compaan, A., Lo, H. W., Aydinli, A. and Lee, M. C.: Laser and Electron–Beam Solid Interactions and Materials Processing, Gibbons, J. F., Hess, L. D. and Sigmon, T. W. eds. (Elsevier North–Holland, Inc., 1981) p. 13.Google Scholar
5. This remark has to be qualified by the fact that no static measurements of the optical properties of submicron layers of molten silicon have been reported.Google Scholar
6. Lowndes, D. H. (submitted for publication);Google Scholar
Lowndes, D. H., Jellison, G. E. and Wood, R. F. (these Proceedings).Google Scholar
7. Wood, R. F., Lowndes, D. H. and Giles, G. E. (these Proceedings).Google Scholar
8. Dash, W. C. and Newman, R., Phys. Rev. 99, 1151 (1955);Google Scholar
Lampert, M. O., Koebel, J. M. and Siffert, P., J. Appl. Phys. 52, 4975 (1981);CrossRefGoogle Scholar
Shvarev, K. M., Baum, B. A. and Gel'd, P. V., High Temperature 15, 548 (1977);Google Scholar
Ukhanov, Yu. I., Soviet Physics – Solid State 3, 1529 (1962);Google Scholar
Algazin, Y. B., Blyumkina, Yu. A., Grebnev, N. I., Svitashev, K. K., Samenenko, L. V. and Yablontseva, T. M., Opt. Spectrosc. 45, 183 (1978);Google Scholar
Weakliem, H. A. and Redfield, D., J. Appl. Phys. 50, 1491 (1979);Google Scholar
Sato, T., Jap. J. Appl. Phys. 6, 339 (1967);CrossRefGoogle Scholar
Philipp, H. R., J. Appl. Phys. 43, 2835 (1972);CrossRefGoogle Scholar
Hulthen, R., Physica Scripta 12, 342 (1975);CrossRefGoogle Scholar
Braunstein, R., Moore, A. R., Herman, F., Phys. Rev. 109, 695 (1958).CrossRefGoogle Scholar
9. Jellison, G. E. and Modine, F. A. (submitted for publication).Google Scholar
10. Renucci, J. B., Tyte, R. N. and Cardona, M., Phys. Rev. B 11, 3885 (1975).CrossRefGoogle Scholar
11. Fabelinskii, I. L., Molecular Scattering of Light (Plenum Press, New York, 1968), Sect. 33.CrossRefGoogle Scholar
12. Griffin, A., Can. J. Phys. 46, 2843 (1968).Google Scholar
13. Callaway, J., Phys. Rev. 113, 1046 (1959).Google Scholar