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Pulsed Laser Treatment of Virgin, Self and Europium Implanted Nickel: Evidence of Defect Impurity Interaction

Published online by Cambridge University Press:  15 February 2011

G. Battaglin
Affiliation:
Unità& GNSM-CNR, Istituto di Fisica, Università di Padova, Italy
A. Carnera
Affiliation:
Unità& GNSM-CNR, Istituto di Fisica, Università di Padova, Italy
G. Della Mea
Affiliation:
Unità& GNSM-CNR, Istituto di Fisica, Università di Padova, Italy
Animesh K. Jain
Affiliation:
Nuclear Physics Division, Bhabha Atomic Research Centre, Bombay–400 085, India
V.N. Kulkarni
Affiliation:
Nuclear Physics Division, Bhabha Atomic Research Centre, Bombay–400 085, India
D.K. Sood
Affiliation:
Nuclear Physics Division, Bhabha Atomic Research Centre, Bombay–400 085, India
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Abstract

We present a comparative study (by 1.8 MeV 4He+ ion channeling) of virgin, self and Eu implanted single crystals of nickel, under irradiation with single ruby laser pulses. The as implanted Eu is nearly non-substitutional and remains so, even after laser treatment. The comparative defect dechanneling behaviour provides explicit evidence of defect-impurity interaction which may be suppressing the formation of an expected metastable solid solution in the Eu-Ni system, which possesses miscibility in the liquid phase. A clear surface Eu peak appears at 2.1 J/cm2.

Type
Research Article
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1.Sood, D.K., in Proc. International Workshop on Ion Implantation, Laser Treatment and Ion Beam Analysis of MaterialsBombayFebruary 9–13, 1981 (to be published in Radiation Effects) and references therein.Google Scholar
2.Sood, D.K., Rad. Eff. Letters (in press).Google Scholar
3.Buene, L., Jacobson, D.C., Nakahara, S., Poate, J.M., Draper, C.W. and Hirvonen, J.K. in: Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, J.F., Hess, L.D. and Sigmon, T.W. eds. (North Holland, New York 1981) pp. 583.Google Scholar
4.Buene, L., Poate, J.M., Jacobson, D.C., Draper, C.W. and Hirvonen, J.K., Appl. Phys. Lett. 37, 385 (1980).Google Scholar
5.Buene, L., Kaufmann, E.N., McDonald, M.L., Kothaus, K., Vianden, R., Freitag, K. and Draper, C.W. in: Nuclear and Electron Resonance Spectroscopies Applied to Materials Science, Kaufmann, E.N. and Shenoy, eds. (Elsevier North Holland, New York 1981) pp. 391.Google Scholar
6.Moffatt, W.G., The Handbook of Binary Phase Diagrams (General Electric Co., Schenectady 1978) (12/79 update).Google Scholar
7.Sood, D.K. and Dearnaley, G., Rad. Effects 39, 157 (1978).Google Scholar
8.Follstaedt, D.M., Picraux, S.T., Peercy, P.S. and Wampler, W.R., Appl. Phys. Lett. 39, 327 (1981).Google Scholar
9.American Institute of Physics Handbook, 3rd ed. (McGraw Hill, New York 1972) p. 6143.Google Scholar
10.Jain, A.K., Kulkarni, V.N., Sood, D.K. and Uppal, J.S., J. Appl. Phys. 52, 4882 (1981).Google Scholar
11.Picraux, S.T., Follstaedt, D.M., Knapp, J.A., Wampler, W.R. and Rimini, E. in: Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, J.F., Hess, L.D. and Sigmon, T.W. eds. (North Holland, New York 1981)pp.575.Google Scholar
12.Sood, D.K., Phys. Lett. 68A, 469 (1978).Google Scholar