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Pulsed Laser Ablation as a Source of Energetic Reactants: Synthesis of Superconducting High to Thin Films

Published online by Cambridge University Press:  16 February 2011

L. Lynds  and
B. R. Weinberger
L. Lynds
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
B. R. Weinberger
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
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Abstract

Pulsed KrF (248 nm) excimer laser ablation of targets can provide a source of atomic particles with energies in the range of 40 – 850 eV with beam-like characteristics. Optical intensities above about 109 W/cm2 lead mainly to single and multiply charged ground state positive atomic ions plus electrons with a pronounced angular energy dependence, the highest energies peaked in the direction normal to the target. A wide mass range of metallic and non-metallic targets were studied to determine the effects of atomic weights and other physical properties on the distribution of ion energies. Analysis of the energetics indicates that ablation mechanisms are non-equilibrium in nature. We have explored the use of very energetic (200–400 eV) Y, Ba and Cu ions to form very thin YBa2Cu3O7-x superconducting films grown on flat gold surfaces. SQUID magnetometry is used to study the temperature and field dependence of magnetization in these materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 191: Symposium N – Laser Ablation for Materials Synthesis , 1990 , 3
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Cheung, J. T. and Sankur, H., CRC Critical Review (Solid State Material Science) 15, 109 (1988).Google Scholar
2. Inam, A., Hegde, M. S., Wu, X. D., Venkatesan, T., England, P., Miceli, P. F., Chase, E. W., Chang, C. C., Tarascon, J. M. and Wachtman, J. B. Appl. Phys Lett. 53, 908 (1988); references therein.Google Scholar
3. Lynds, L. and Woody, B. A., J. Elect. Spect. Rel. Phenom. 29 1191 (1983).Google Scholar
4. Lynds, L., Weinberger, B. R., Peterson, G. G. and Krasinski, H. A., Appl. Phys. Lett. 52, 320 (1988).Google Scholar
5. Lynds, L., Weinberger, B. R., Potrepka, D.M., Peterson, G. G.and Lindsay, M. P., Physica C 159, 61 (1989).Google Scholar