Hostname: page-component-6bf8c574d5-xtvcr Total loading time: 0 Render date: 2025-02-18T06:37:45.259Z Has data issue: false hasContentIssue false
  • English
  • Français

Proton Induced Kossel Diffraction of X-Rays in Copper

Published online by Cambridge University Press:  25 February 2011

C. Jorge Rickards
C. Jorge Rickards*
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, Apdo. Postal 20-364, 01000 México, D.F., MEXICO
Get access

Abstract

A 700 keV proton beam was used to induce the emission of X-rays in a single crystal copper target. The X-rays are diffracted inside the target, giving rise to a large number of lines, which were recorded on photographic film. The presence of certain lines and the absence of others, as well as the variable intensity along the lines, are explained qualitatively with a kinematical approach.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 69: Symposium D – Materials Characterization , 1986 , 299
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.- Geist, V. and Flagmeyer, R., Phys. Stat. Sol. (a) 26, K1 (1974).Google Scholar
2.- Roberto, J.B., Batterman, B.W., Kostroun, V.O. and Appleton, B.R., J. Appl. Phys. 46, 936 (1975).Google Scholar
3.- D-ingley, D.J., Scanning Electron Microscopy, Vol. I, 869 (1978).Google Scholar
4.- Geist, V. and Ascheron, C., Crystal Res. and Technol., 19, 1231 (1984).Google Scholar
5.- Jeffery, J.W., Methods in X-ray Crystallography, Academic Press (1971).Google Scholar