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Probing the Surface-Vacuum Interface with Spin-Sensitive Metastable Atom Deexcitation, Electron Capture and Electron Emission Spectroscopies

Published online by Cambridge University Press:  03 September 2012

G. K. Walters  and
C. Rau
G. K. Walters
Affiliation:
Physics Department and Rice Quantum Institute, Rice University, Houston, TX 77251–1892
C. Rau
Affiliation:
Physics Department and Rice Quantum Institute, Rice University, Houston, TX 77251–1892
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Abstract

Spin-Polarized Metastable Atom Deexcitation (SPMDS) and Electron Capture (ECS) Spectroscopies probe the exponential tails of electronic wavefunctions extending from the surface into the vacuum, and are consequently extremely sensitive to the surface-vacuum interface. The use of SPMDS to probe the near-surface vacuum magnetization of Ni (l 10) and Fe (l 10) and the dramatic changes that result upon exposure to ambient gases is discussed, as is the use of ECS and Spin-Polarized Electron EMission Spectroscopy (SPEES) to determine the ferromagnetic and critical behavior of surfaces and ultra-thin epitaxial systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 577
Copyright
Copyright © Materials Research Society 1993

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References

1. Dunning, F.B., Rau, C. and Walters, G.K., Comm. on Solid Physics, 12, 17 (1985).Google Scholar
2. Onellion, M., Hart, M.W., Dunning, F.B. and Walters, G.K., Phys. Rev. Lett., 52, 380 (1984).Google Scholar
3. Hammond, M.S., Dunning, F. B., Walters, G. K. and Prinz, G.A., Phys. Rev B, 45, 3674 (1992).Google Scholar
4. Riddle, T.W., Onellion, M., Dunning, F.B. and Walters, G.K., Rev. Sci. Instrum., 52, 797 (1981).Google Scholar
5. Tang, F.-C., Zhang, X., Dunning, F.B. and Walters, G.K., Rev. Sci. Instrum., 59, 504 (1988).Google Scholar
6. Penn, D.R. and Apeli, P., Phys. Rev. B, 41, 3303 (1990).Google Scholar
7. Wimmer, E., Freeman, A.J. and Krakauer, H., Phys. Rev. B, 30, 3113 (1984).Google Scholar
8. Rau, C., J. Magn. Magn. Mater., 30, 141 (1982).Google Scholar
9. Wu, R. and Freeman, A.J., Phys. Rev. Lett., 69, 2867 (1992).Google Scholar
10. Hart, M.W., Hammond, M.S., Dunning, F. B. and Walters, G.K., Phys. Rev. B, 39, 5488 (1989).Google Scholar
11. Oró, D.M., Lin, Q., Soletsky, P.A., Zhang, X., Dunning, F.B. and Walters, G.K., Phys. Rev. B, 46, 9893 (1992).Google Scholar
12. Kisker, E., Gudat, W. and Schröder, K.S., Solid State Commun., 44, 591 (1982).Google Scholar
13. Unguris, J., Pierce, D. T., Galejs, A. and Celotta, R.J., Phys. Rev. Lett., 49, 72 (1982).Google Scholar
14. Kirschner, J., Koike, K. and Oepen, H.P., Vacuum, 41, 518 (1990); Phys. Rev. Lett., 59, 2099 (1987).Google Scholar
15. Rau, C., Appl. Phys. A 49, 579 (1989).Google Scholar
16. Rau, C., Waters, K., and Chen, N., Phys. Rev. Lett., 64, 1441 (1990).Google Scholar
17. Rau, C., J. Magn. Magn. Mater., 30, 141 (1982).Google Scholar
18. Rau, C. and Eichner, S., Phys. Rev. Lett., 47, 939 (1981).Google Scholar
19. Rau, C., Jin, C. and Robert, M., Phys. Lett. A, 138, 334 (1989).Google Scholar
17. Rau, C., Mahavadi, P., and Lu, M., J. Appl. Phys. (1993), in print.Google Scholar
18. Yang, N., Phys. Rev., 85, 808 (1952).Google Scholar
19. Rau, C., Zheng, N. J. and Lu, M., J. Magn. Magn. Mat., (1993), in print.Google Scholar
20. Balberg, J. and Helman, J. S., Phys. Rev. B, 18, 303 (1978).Google Scholar
21. Alvarado, S. F., Campagna, M., and Hopster, H., Phys. Rev. Lett., 48, 51 (1982);Google Scholar
Dauth, B. H., Alvarado, S. F., and Campagna, M., Phys. Rev. Lett., 58, 2118 (1987).Google Scholar
22. Rau, C., Xing, G., Liu, C. and Robert, M., Phys. Lett., 135, 227 (1989).Google Scholar
23. Diehl, H. W. and Eisenriegler, E., Phys. Rev. B, 30, 300 (1984).Google Scholar
24. Quinn, J., Li, Y.S., Li, H., Tian, D., Jona, F. and Marcus, P.M., Phys. Rev. B, 43, 3959 (1991).Google Scholar
25. Kirschner, J., in Surface and Interface Characterization bv Electron Optical Methods, ed. by Howie, A. and Valdré, U. (Plenum Publ. Co., 1988), p. 297.Google Scholar
26. Kirschner, J., Koike, K., and Oepen, H.P., Phys. Rev. Lett., 59 (1987) 2099.Google Scholar
27. Landolt, M., in “Polarized Electrons in Surface Physics”, ed. by Feder, R. (World Sci. Publ. Co., 1985), Chap. 9; and Refs. cited therein.Google Scholar
28. Baragiola, R.A., Alonso, E.V., and Oliva-Florio, A., Phys. Rev. B 61, 121 (1979).Google Scholar
29. Fu, C.L., Freeman, A.J., and Oguchi, T., Phys. Rev. Lett. 54, 2700 (1985).Google Scholar
30. Krewer, J.W. and Feder, R., Physica B (1991) 135; and Refs. cited therein.Google Scholar
31. Penn, D. and Apell, P., and Girvin, S.M., Phys. Rev. Lett. 55, 518 (1985).Google Scholar
32. Glaser, J. and Tosatti, E., Sol. Stat. Comm. 52, 905 (1984).Google Scholar