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Probe Rotating Atomic Force Microscopy for material characterization

Published online by Cambridge University Press:  14 July 2014

Sang Heon Lee
Sang Heon Lee*
Affiliation:
Dept. of Mechanical Design Engineering, Andong National University, Andong 760-749, Korea
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Abstract

As the conventional atomic force microscopy (AFM) uses a Cartesian coordinate system to scan sample and the probe has different characteristics in each direction, it is impossible to scan in arbitrary direction. Therefore, we present the AFM which is able to rotate its probe. The deflection of cantilever was measured using optical pickup head of DVD drive. For verifying the system feasibility, the multidirectional scanning of the standard sample was carried out. Also we presented the modified structure which includes aligner and mirror to enhance the performance.

Keywords

scanning probe microscopy (SPM)lithography (removal)nano-indentation
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1712: Symposium ZZ/AAA/BBB – Recent Advances in the Structural Characterization of Materials , 2014 , mrss14-1712-bbb04-02
Copyright
Copyright © Materials Research Society 2014 

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References

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