Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T07:23:20.797Z Has data issue: false hasContentIssue false

Pressure Dependence of the Tetragonal-Orthorhombic Transition in La1.88 Sr0.12 Cu O4-δ: A Single Crystal X-Ray Study

Published online by Cambridge University Press:  28 February 2011

R. Moret
Affiliation:
Laboratoire de Physique des Solides, UA 2, Université Paris Sud, 91405 Orsay, France
G. Collin
Affiliation:
UA 200, Université René Descartes, 4 Avenue de l'Observatoire, 75006 Paris, France.
Get access

Abstract

We report the first combined high pressure (up to 30 kbar) and low temperature (10 K - 300 K) single crystal X-ray diffraction study of the tetra-gonal-orthorhombic transition in La2−xCuO4-δ(x=0.12). Superstructure reflections of the orthorhombic phase were used to characterize the transition. The transition temperature, TT–O, is found to decrease under pressure and the orthorhombic phase is suppressed above about 15 kbar. These results confirm that both phases are superconducting and suggest to attribute a previously reported kink in dTc/dP to different rates of increase of Tc for the tetragonal and orthorhombic phases.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Jorgensen, J.D., Schuttler, H.B., Hinks, D.G., Capone, D.W. II, Zhang, K., Brodsky, M.B. and Scalapino, D.J., Phys. Rev. Lett., 58, 1024(1987);Google Scholar
Cava, R.J., Santoro, A., Johnson, D.W. Jr and Rhodes, W.W., Phys. Rev. B35, 6716 (1987);Google Scholar
Francois, M., Yvon, K., Fisher, P. and Decroux, M., Solid State Com. 63, 35 (1987).Google Scholar
Vaknin, D., Sinha, S.K., Moncton, D.E., Johnston, D.C., Newsam, J.M., Safinya, C. R. and King, H.E. Jr, Phys. Rev. Lett. 58, 2802 (1987).Google Scholar
[2] Paul, D. Mc K., Balakrishnan, G., Bernhoeft, N.R., David, W.I.F. and Harrison, W.T.A., Phys. Rev. Lett., 56, 1976 (1987).Google Scholar
[3] Day, P., Rossensky, M., Prassides, K., David, W.I.F., Moze, O. and Soper, A. J. Phys. C, 20, 429 (1987).Google Scholar
[4] Fleming, R.M., Batlogg, B., Cava, R.J. and Rietman, E.A., Phys. Rev. 1335, 7191 (1987).Google Scholar
[5] Longo, J.M. et al., J. Solid State Chem., 6, 529 (1973);Google Scholar
Grande, V.B. et al., Z. Anorg. Allg. Chem., 428, 120 (1977);Google Scholar
Onoda, M. et al., J. Appl. Phys., 26, L363 (1987);Google Scholar
Wang, H.H. et al., Inorg. Chem., 26, 1190 (1987);Google Scholar
Geiser, V. et al., Phys. Rev., B35, 6721 (1987).Google Scholar
[6] Moret, R., Pouget, J.P. and Collin, G., Europhysics Lett., 4, 365 (1987).Google Scholar
[7] Fujita, T., Aoki, Y., Maeno, Y., Sakurai, J., Fukuba, H. and Fujii, H., Jpn. J. Appl. Phys., 26, L368 (1987).Google Scholar
[8] Johnston, D.C., Stokes, J.P., Goshorn, D.P. and Lewandowski, J.T., Phys. Rev. B36, 4007. (1987):Google Scholar
Johnston, D.C. et al.,Spring Meeting of the MRS, Anaheim, 87, unpublished.Google Scholar
[9] Moss, S.C., Forster, K., Axe, J.D., You, H., Holwein, D., Cox, D.E., Hor, P.H., Meng, R.L. and Chu, C.W., Phys. Rev., B35, 7195 (1987).Google Scholar
[10] Griessen, R., Phys. Rev., B36, 5284 (1987).Google Scholar
[11] Collin, G. and Comes, R., CR. Acad. Sci., 304, 1159 (1987).Google Scholar
[12] Michel, C and Raveau, B., Rev. Chim. Miner., 21, 407 (1984);Google Scholar
Kang, W., Collin, G., Ribault, M., Friedel, J., Jerome, D., Bassat, J.M., Coutures, J.P. and Odier, P., J. Physique, 48, 1181 (1987).Google Scholar
[13] Bridgman, P.W., Proc. Amer. Acad. Arts. Sci., 76, 1 (1945).Google Scholar
[14] Samara, G.A., Comments on Sol. State Phys., 8, 13 (1977).Google Scholar
[15] Samara, G.A., Sakudo, T. and Yoshimitsu, K., Phys. Rev. Lett., 35, 1767, (1975).Google Scholar
[16] D'Iorio, M. and Armstrong, R. L., Can. J. Phys., 61, 1374 (1983).Google Scholar
[17] Birgeneau, R.J., Chen, C.Y., Gabbe, D.R., Jenssen, H.P., Kastner, M.A., Peters, C.J., Picone, P.J., Thio, T., Thurston, T.R. and Tuller, H.L., Phys. Rev. Lett., 59, 1329 (1987).Google Scholar
[18] Shelton, R.N., Folkerts, T.J., Klavins, P. and Ku, H.C., Extented Abstracts, MRS Meeting, Anaheim, April 1987, eds. Gubber, D.U. and Schlüter, M..Google Scholar
[19] Dietrich, M.R., Fietz, W.H., Ecke, J., Obst, B. and Politis, C., Z. Phys. B66 283 (1987).Google Scholar
[20] Yomo, S., Murayama, C., Takahashi, H., Mori, N., Kishio, K., Kitazawa, K. and Fueki, K., Jpn. J. Appl. Phys., 26, L603 (1987).Google Scholar