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Preparation of Ultrafine Supported Clusters for Electron Microscopy Studies

Published online by Cambridge University Press:  15 February 2011

A. Singhal  and
J. Murray Gibson
A. Singhal
Affiliation:
Frederick Seitz Materials Research Laboratory, 104 S. Goodwin Ave., Department of Materials Science & Engineering, University of Illinois, Urbana, IL 61801 Frederick Seitz Materials Research Laboratory, 104 S. Goodwin Ave., Department of Physics and Materials Science & Engineering, University of Illinois, Urbana, IL 61801
J. Murray Gibson
Affiliation:
Frederick Seitz Materials Research Laboratory, 104 S. Goodwin Ave., Department of Physics and Materials Science & Engineering, University of Illinois, Urbana, IL 61801
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Abstract

In this paper, we discuss the sintering/fragmentation behavior of novel oganometallic rhenium compounds (candidates as catalyst materials) under high energy electron beam irradiation. The technique used was quantitative electron microscopy based on high angle annular dark field (HAADF) imaging in a scanning transmission electron microscope (STEM). Using this approach, we examine elastically-scattered electron intensity from graphite-supported rhenium clusters, and look for mass quantization. The emphasis in this article is not on the imaging technique, but on various sample preparation techniques, materials and synthesis issues of supports and of deposition of very small isolated clusters.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 404: Symposium J – In Situ Electron and Tunneling Microscopy of Dynamic Processes , 1995 , 155
Copyright
Copyright © Materials Research Society 1996

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