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Preparation of Tem Plan View Sections on Specific Devices Using the Tripod Polisher
Published online by Cambridge University Press: 10 February 2011
Abstract
Plan view or “top down” sections of specific sites for TEM analysis can be prepared by mechanically polishing the specimen with the Tripod Polisher. This technique produces plan view sections with a large area available for TEM analysis that encompasses the specific site. Because the sample is mechanically polished, the problem of surface topography due to non uniform thinning is minimized.
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- Research Article
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- Copyright © Materials Research Society 1998
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