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Preparation and Characterization of the Single-Layered Cobaltate La2-xCaxCoO4

Published online by Cambridge University Press:  14 January 2011

D. Fuchs ,
M. Merz ,
R. Schneider  and
H. v. Löhneysen
D. Fuchs
Affiliation:
Karlsruher Institut für Technologie, Institut für Festkörperphysik, 76021 Karlsruhe, Germany
M. Merz
Affiliation:
Karlsruher Institut für Technologie, Institut für Festkörperphysik, 76021 Karlsruhe, Germany
R. Schneider
Affiliation:
Karlsruher Institut für Technologie, Institut für Festkörperphysik, 76021 Karlsruhe, Germany
H. v. Löhneysen
Affiliation:
Karlsruher Institut für Technologie, Institut für Festkörperphysik, 76021 Karlsruhe, Germany Karlsruher Institut für Technologie, Physikalisches Institut, 76131 Karlsruhe, Germany
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Abstract

Polycrystalline samples of the single-layered cobaltate La2-xCaxCoO4 were prepared in a wide doping range of 0 ≤ x ≤ 1.5. Structural properties were characterized at room temperature. The orthorhombic distorted structure of the mother compound La2CoO4 changes to a tetragonal structure for x = 0.5 and then becomes orthorhombic again for x > 0.5. The magnetic properties were investigated in the temperature range from 5 K ≤ T ≤ 300 K. With increasing hole-doping a successive decrease of antiferromagnetic exchange is observed for x ≤ 0.5 whereas an increase of ferromagnetic exchange evolves for x ≥ 0.5.

Keywords

oxidemagnetic propertiesCo
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1292: Symposium K – Oxide Nanoelectronics , 2011 , mrsf10-1292-k12-09
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Yamada, K., Matsuda, M., Endoh, Y., Keimer, B., Birgenau, R. J., Onodera, S., Mizukawa, J., Matsuura, T., and Shirane, G., Phys. Rev. B 39, 2336 (1989).Google Scholar
2. Moritomo, Y., Higashi, K., Matsuda, K., and Nakamura, A., Phys. Rev. B 55, R14725 (1997).Google Scholar
3. Korotin, M. A., Ezhov, S. Y., Solovyev, I. V., Anisimov, V. I., Khomskii, D. I., and Sawatzky, G. A., Phys. Rev. B 54, 5309 (1996).Google Scholar
4. Saitoh, T., Mizokawa, T., Fujimori, A., Abbate, M., Takeda, Y., and Takano, M., Phys. Rev. B 55, 4257 (1997).Google Scholar
Matsuno, J., Okimoto, Y., Fang, Z., Yu, X. Z., Matsui, Y., Nagaosa, N., Kumigashira, H., Oshima, M., Kawasaki, M., and Tokura, Y., Thin Solid Films 486, 113 (2005).Google Scholar
6. Horigane, K., Uchida, T., and Akimitsu, J., Physica B 378–380, 334 (2006).Google Scholar
7. Horigane, K., Hiraka, H., Uchida, T., Yamada, K., and Akimitsu, J., J. Phys. Soc. Jpn. 76, 14715 (2007).Google Scholar
8. Horigane, K., Kobayashi, T., Suzuki, M., Abe, K., Asai, K., and Akimitsu, J., Phys. Rev. B 78, 144108 (2008).Google Scholar
9. Balz, D. and Blieth, K., Z. Elektrochem 59, 545 (1955).Google Scholar
10. Chichev, A. V., Dlouhá, M., Vratislav, S., Kizek, K., Hejtmánek, J., Marysko, M., Ververka, M., Jirák, Z., Golosova, N. O., Kozlenko, D. P., and Savenko, B. N., Phys. Rev. B 74, 134414 (2006).Google Scholar