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Post-Synthesis Crystallinity Tailoring of Water-Soluble Polymer Encapsulated CdTe Nanoparticles using Rapid Thermal Annealing

Published online by Cambridge University Press:  31 January 2011

Steven Rutledge ,
Abdiaziz A. Farah ,
Jordan Dinglasan ,
Darren Anderson ,
Anjan Das ,
Jane Goh ,
Cynthia Goh  and
Amr S. Helmy
Steven Rutledge
Affiliation:
[email protected], University of Toronto, Electrical and Computer Engineering, Toronto, Canada
Abdiaziz A. Farah
Affiliation:
[email protected], University of Toronto, Electrical and Computer Engineering, Toronto, Canada
Jordan Dinglasan
Affiliation:
[email protected], Vive Nano Incorporated, Toronto, Canada
Darren Anderson
Affiliation:
[email protected], Vive Nano Incorporated, Toronto, Canada
Anjan Das
Affiliation:
[email protected], Vive Nano Incorporated, Toronto, Canada
Jane Goh
Affiliation:
[email protected], University of Toronto, Chemistry, Toronto, Canada
Cynthia Goh
Affiliation:
[email protected], University of Toronto, Chemistry, Toronto, Canada
Amr S. Helmy
Affiliation:
[email protected], University of Toronto, Electrical and Computer Engineering, Toronto, Canada
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Abstract

The crystallinity of colloidal CdTe nanoparticles has been enhanced post synthesis. This control over the nanoparticles’ properties has been achieved using non-adiabatic thermal processing. The technique preserves the polymer capping and hence introduces no adverse effects on the nanoparticles’ optical properties. The crystallinity is probed primarily through Raman spectroscopy in a hollow core photonic crystal fiber and x-ray diffraction powder studies.

Keywords

x-ray diffraction (XRD)semiconductingRaman spectroscopy
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1207: Symposium N – Colloidal Nanoparticles for Electronic Applications — Light Emission, Detection, Photovoltaics and Transport , 2009 , 1207-N03-08
Copyright
Copyright © Materials Research Society 2010

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References

[1] Singh, R., J. Appl. Phys. 63, R59. (1998),Google Scholar
[2] Bhattacharayya, D., Helmy, A. S., Bryce, A. C., Avrutin, E. A., Marsh, J.H., J. Appl. Phys. 88, 4619 (2000)Google Scholar
[3] Schaarschmidt, A., Farah, A. A., Aby, A., Helmy, A. S., J. Phys. Chem. B 113, 9352 (2009)Google Scholar
[4] a) Murray, C. B., Kagan, C. R., Bawendi, M. G.. Annu. Rev. Mater. Sci., 30, 545 (2000). b) M. G. Bawendi, M. L. Steigerwald, L. E. Brus. Annu. Rev. Phys. Chem., 41, 477 (1990). c) A. P. Alivisatos. Science 271, 933 (1996). d) R. C. Somers, M. G. Bawendi, D. C. Nocera, Chem. Soc. Rev., 36, 579 (2007).Google Scholar
[5] Kang, Y., Park, N., Kim, D.. Appl. Phys. Lett., 86, 113101 (2005).Google Scholar
[6] Dooley, C., Dimitrov, S., Fiebig, T., J. Phys. Chem. C, 112, 12074 (2008).Google Scholar
[7] Agarwal, A., Lilly, G., Govorov, A., Kotov, N., J. Phys. Chem. C, 112, 18314 (2008).Google Scholar
[8] Irizar, J., Dinglasan, J., Goh, J. B., Khetani, A., Anis, H., Anderson, D., Goh, C., Helmy, A. S., IEEE J. Select. Top. Quant. Electron., 14, 1214 (2008).Google Scholar
[9] Ochoa, O., Witkowski, E. III , Colajacomo, C., Simmons, J., Potter, B. Jr , J. Mat. Sci. Lett., 16, 613 (1997)Google Scholar
[10] Morell, G., Reynés-Figueroa, A., Katiyar, R., Farias, M., Espinoza-Beltran, F., Zelaya-Angel, O., Sánchez-Zinencio, F., J. Raman Spectroscopy, 25, 203 (1994).Google Scholar
[11] Vinogradov, V., Karczwski, G., Kucherenko, I., Mel'nik, N., Fernadez, P., Physics of the Solid State, 50, 164 (2008).Google Scholar
[12] Caballero-Briones, F., Zapata-Navarro, A., Martel, A., Iribarren, A., Peña, J., Castro-Rodríguez, R., Bartolo-Pérez, P., Rábago-Bernal, F., Jiménez-Sandoval, S., Superfices y Vacio, 16, 38 (2003).Google Scholar
[13] Niu, Y.-H., Munro, A. M., Cheng, Y.-J., Tian, Y., Liu, M. S., Zhao, J., Bardecker, J. A., Plante, I. J.-L., Ginger, D. S., Jen, A. K.-Y., Advanced Materials, 19, 3371 (2007).Google Scholar
[14] Dayal, P. B., Mehta, B. R., Shivaprasad, S. M., Jpn. J. Appl. Phys., 44, 8222 (2005).Google Scholar
[15] Bandaranayake, R. J., Wen, G. W., Lin, J. Y., Jiang, H. X., Sorenson, C. M., Appl. Phys. Lett, 6, 831 (1995).Google Scholar