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Polarization Dynamics in La5/3Sr1/3NiO4

Published online by Cambridge University Press:  10 February 2011

N. Hakim ,
Z. Zhai ,
C. Kusko ,
P.V. Parimi ,
S-W. Cheong  and
S. Sridhar
N. Hakim
Affiliation:
Physics Department, Northeastern University, 360 Huntington Avenue, Boston, MA 02115
Z. Zhai
Affiliation:
Physics Department, Northeastern University, 360 Huntington Avenue, Boston, MA 02115
C. Kusko
Affiliation:
Physics Department, Northeastern University, 360 Huntington Avenue, Boston, MA 02115
P.V. Parimi
Affiliation:
Physics Department, Northeastern University, 360 Huntington Avenue, Boston, MA 02115
S-W. Cheong
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08855
S. Sridhar
Affiliation:
Physics Department, Northeastern University, 360 Huntington Avenue, Boston, MA 02115
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Abstract

Dynamic susceptibility measurements at microwave frequencies (2 – 10GHz) are a sensitive probe of charge dynamcis in La5/3Sr1/3NiO4. Below the charge ordering temperature of 240K, a dielectric loss peak due to a relaxation mode with a large dielectric susceptibility is observed, and is associated with charge stripe formation. The dielectric response for Hω∥b (Eω ⊥ b) is well represented by ε(T) = εo/(1 – iωτ(T)), with εo, ∼ 50, and τ(T) = 2 × 10−9(sec) exp(−T/37K). Parallel conductivity σ(T) contributions dominate at higher temperatures and for Hω∥c (Eω ⊥ c). The dielectric loss peak observed indicates that the charge relaxation rates lie in the GHz frequency ranges.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 602: Symposium JJ – Magnetoresistive Oxides & Related Materials , 1999 , 35
Copyright
Copyright © Materials Research Society 2000

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References

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