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Point Defects and Diffusion in Ni3Ga

Published online by Cambridge University Press:  10 February 2011

T. IKEDA
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
A. Almazouzi
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
A. Funao
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
H. Numakura
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
M. Koiwa
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
Y. Shirai
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto 606, Japan
K. Nonaka
Affiliation:
Department of Materials Science and Technology, Iwate University, Morioka 020, Japan.
W. Sprengel
Affiliation:
The Institute of Scientific and Industrial Research, Osaka University, Ibaraki 567, Japan.
H. Nakajima
Affiliation:
The Institute of Scientific and Industrial Research, Osaka University, Ibaraki 567, Japan.
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Abstract

The properties of intrinsic point defects and the self-diffusion behaviour of the constituent elements in Ni3Ga have been studied by positron annihilation, tracer diffusion and interdiffusion experiments. Thermal vacancies have been detected by positron lifetime measurements for specimens quenched from high temperatures. The vacancy formation energy is in the range between 1.7 and 1.8 eV, and is not dependent strongly on the composition. The tracer diffusion coefficients of Ni and Ga are of the same order of magnitude, and the interdiffusion coefficient is about 10 times larger than the diffusion coefficient of Ni. The diffusion in Ni3Ga has been found to satisfy the Darken-Manning equation, as expected from the model of the self-diffusion in this type of materials, where both the species of atoms are assumed to migrate primarily in the sub-lattice of the major element via the ordinary vacancy mechanism.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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