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Plastic Deformation and Micro-Fracture in SiO2 Induced by Electron Beam Irradiation

Published online by Cambridge University Press:  28 February 2011

P. M. Ajayan  and
Sumio Iijima
P. M. Ajayan
Affiliation:
Nec Corporation, Fundamental Research Laboratory, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan
Sumio Iijima
Affiliation:
Nec Corporation, Fundamental Research Laboratory, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan
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Abstract

We present here experimental results using transmission electron microscopy (TEM) and real time video recordings, of the many dynamic structural instabilities in amorphous silica structures during intense electron beam irradiation. It is observed that while the silica layers on oxidized silicon particles sinter when irradiated uniformly, they undergo necking and extensive plastic deformation when the beam is focused in the neck regions. Extremely thin silica fibers (less than five nanometers in diameter and microns in length) can be produced by the deformation of such necks between particles. The thin fibers and the sharp tips developed from the failure of such structures are seen to spheroidize and blunt when exposed to the electron beam. The instabilities are thought to arise from irradiation induced charging of the insulator surface which expands to reduce the density of accumulated surface charges.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 413
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Bovin, J. O., Wallenberg, R. and Smith, D. J., Nature, 317, 47 (1985).CrossRefGoogle Scholar
2. Iijima, S., and Ichihashi, T., Phys. Rev. Lett., 56, 616 (1986).CrossRefGoogle Scholar
3. Ajayan, P. M. and Marks, L. D., Phys. Rev. Lett., 63, 279 (1989).CrossRefGoogle Scholar
4. Ajayan, P. M. and Iijima, S., Phil. Mag. Lett., in press.Google Scholar
5. Thomas, S., J. Appl. Phys., 45, 161 (1974).CrossRefGoogle Scholar
6. Raider, S.I., Herd, S.R. and Walkup, R. E., Appl. Phys. Lett., 59, 2424 (1991).CrossRefGoogle Scholar
7. Okada, R. and Iijima, S., Appl. Phys. Lett., 58, 1662 (1990).CrossRefGoogle Scholar
8. Ajayan, P. M. and Iijima, S., J. Am. Cer. Soc, Submitted.Google Scholar
9. Ajayan, P. M., Ichihashi, T. and Iijima, S., Radiation Effects, in press.Google Scholar
10. Nichols, F. A. and Mullins, W. W., J. Appl. Phys., 36, 1826 (1965).CrossRefGoogle Scholar
11. Ajayan, P. M. and Iijima, S., Presented at the 5th Int. Conf. Non. Cryst. Mat., 1991, Sendai, Japan, to appear in J. Non. Cryst. Solids.Google Scholar
12. Bletry, J., Phil. Mag., 62, 469 (1990).CrossRefGoogle Scholar
13. Vassamillet, L. F. and Caldwell, V. E., J. Appl. Phys., 40, 1637 (1969).CrossRefGoogle Scholar