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Plasmonic Oscillations in Au Nano-rods Fabricated by Electron Beam Lithography

Published online by Cambridge University Press:  17 April 2019

Urcan Guler
Affiliation:
Department of Physics, Middle East Technical University, Inonu Boulevard, Cankaya, Ankara 06531, Turkey
Rasit Turan
Affiliation:
Department of Physics, Middle East Technical University, Inonu Boulevard, Cankaya, Ankara 06531, Turkey
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Abstract

Localized Surface Plasmon Resonances (LSPR) in rod-shaped Gold (Au) nanoparticles patterned with Electron Beam Lithography (EBL) technique are observed via reflectance measurements. Resonance peaks corresponding to the principal axes of the nano-rods are shown to be affected by each other. Excitation of one of the peaks is found to result in a decrease in the peak intensity of the resonance through the other axis. Arrays of Au nanoparticles with constant width and thickness but increasing length are examined for further understanding of the effect. As the particle length increased from 70 nm to 300 nm, resonance peak wavelength shifted from 650 nm to 1200 nm. Total reflectance intensities of samples with varying principal axis dimensions obtained through the spectral region of interest are also examined to see the relation between contributing electrons and total amount of reflected intensity. Results corresponding to both polarized and unpolarized illumination of samples are presented together to gain better understanding of lowered reflectance peak intensities obtained from the latter case. Based on the results obtained so far, nano-sized metal rods are promising tools for optically switched intensity modulation in the visible and near-IR region.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1. Tanabe, K., Materials Letters 61, 4573 (2007).Google Scholar
2. Gotschy, W., Vonmetz, K., Leitner, A. and Aussenegg, F. R., Appl. Phys. B 63, 381 (1996).Google Scholar
3. Doremus, R. H. and Rao, P., J. Mater. Res. 11, 2834 (1996).Google Scholar
4. Kottman, J. P., Martin, O. J. F., Smith, D. R. and Schultz, S., New Journal of Phys. 2, 27 (2000).Google Scholar
5. Hicks, E. M., Gunnarrsson, L., Rindevicius, T., Zou, S., Kasemo, B., Kall, M., Schatz, G. C., Spears, K. G. and Van Duyne, R. P., Mater. Res. Soc. Symp. Proc. 872 (2005).Google Scholar
6. Adato, R., Yanik, A. A., Wu, C.H., Shvets, G. and Altug, H., Opt. Express 18, 4526 (2010).Google Scholar
7. Stuart, H. R. and Hall, D. G., Appl. Phys. Lett. 73, 3815 (1998).Google Scholar
8. Schaadt, D. M., Feng, B. and Yu, E. T., Appl. Phys. Lett. 86, 063106 (2005).Google Scholar
9. Derkacs, D., Lim, S. H., Matheu, P., Mar, W. and Yu, E. T., Appl. Phys. Lett. 89, 093103 (2006).Google Scholar
10. Nakayama, K., Tanabe, K., Atwater, H., Proc. of SPIE 7047, 704708 (2008).Google Scholar
11. Maier, S. A., Kik, P. G. and Atwater, H. A., Appl. Phys. Lett. 81, 1714 (2002).Google Scholar