Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-27T01:52:16.243Z Has data issue: false hasContentIssue false

Plan-View CBED Studies of Nio-Zro2(CaO) Interfaces

Published online by Cambridge University Press:  25 February 2011

V.P. Dravid
Affiliation:
Department of Materials Science & Engg., Lehigh University, Bethlehem, PA 18015, USA
M.R. Notis
Affiliation:
Department of Materials Science & Engg., Lehigh University, Bethlehem, PA 18015, USA
C.E. Lyman
Affiliation:
Department of Materials Science & Engg., Lehigh University, Bethlehem, PA 18015, USA
A. Revcolevschi
Affiliation:
Laboratoire de Chimie des Solides, Universite de Paris-Sud, 91405 Orsay Cedex, FRANCE
Get access

Abstract

Low energy lamellar interfaces in the directionally solidified eutectic (DSE) NiO-ZrO2(CaO) have been investigated using transmission electron diffraction and imaging. The symmetry of this bicrystal and an aspect of interfacial relaxations in the form of symmetry lowering in-plane rigid body translation (RBT) have been explored by performing convergent beam electron diffraction (CBED) experiments of plan-view bicrystals. Edge-on interfaces have also been studied by conventional and high resolution transmission electron microscopy (CTEM and HRTEM respectively), and electron diffraction fine structure analysis. Despite certain experimental difficulties due to interfacial defects and strain, plan-view CBED patterns offered valuable information concerning bicrystal symmetry and indicated no symmetry lowering RBT in this bicrystal. The suitability of plan-view CBED is briefly discussed in view of its potential as a technique to determine bicrystal symmetry and RBT.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Sutton, A.P. and Balluffi, R.W., Acta Met., 35, 2177 (1987).Google Scholar
2) Pond, R.C., in Dislocation in Solids, 8, edited by Nabarro, F.R.N. (North-Holland, Amsterdam, 1989).Google Scholar
3) Bollman, W.,in Crystal Defects and Crystalline Interfaces (Springer-Verlag, Berlin 1970)Google Scholar
4) Pond, R.C. and Bollman, W., Phil. Trans. Royal Soc. London, 292, 449 (1979).Google Scholar
5) Pond, R.C. and Vlachavas, D.S., Proc. Royal Soc. London, A386, 95 (1983).Google Scholar
6) Schapink, F.W., Forghany, S.K.E. and Buxton, B.F., Acta Cryst., A39, 805 (1983).Google Scholar
7) Eaglesham, D.J., Kiely, C.J., Cherns, D. and Missous, M., Phil. Mag., A60 No.2, 161(1989).Google Scholar
8) Dravid, V.P., Lyman, C.E. and Notis, M.R., unpublished research.Google Scholar
9) Dhalenne, G. and Revcolevschi, A., J. Crvst. Growth, 69, 616 (1984).Google Scholar
11) Dravid, V.P., Notis, M.R. and Lyman, C.E. unpublished research.Google Scholar
12) Eaglesham, D.J., in Proc. 47th annual meeting of EMSA, edited by Bailey, G.W. (San Francisco Press, CA) 480 (1989).Google Scholar
13) Pond, R.C. and Vitek, V., Proc. R. Soc., A357, 453 (1977)Google Scholar