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Picosecond Optical Second Harmonic Studies of Adsorbate Reduction Kinetics on Cadmium Sulfide

Published online by Cambridge University Press:  22 February 2011

T. W. Scott ,
J. Martorell  and
Y. J. Chang
T. W. Scott
Affiliation:
Department of Chemistry, New York University, New York, NY
J. Martorell
Affiliation:
Department of Physics, University of Barcelona, Barcelona, Spain
Y. J. Chang
Affiliation:
Department of Chemistry, Brookhaven National Laboratory, Upton, NY
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Abstract

Time resolved surface second harmonic generation has been used to probe the photoreduction kinetics of malachite green adsorbed onto single crystal cadmium sulfide. A detailed analysis is presented of how the adsorbates and the noncentrosymmetric substrate contribute separately to the total second harmonic signal. Conditions under which the adsorbates can be cleanly detected are described. To complement kinetic measurements of adsorbate reduction, the time evolution of conduction band carriers was determined using sum frequency up conversion of the recombination luminescence. In addition, the formation and decay of surface trapped carriers was monitored using near infrared transient absorption. Comparing the time scale for photoreduction with the relaxation kinetics of mobile and trapped charge carriers indicates that short lived mobile carriers rather than longer lived surface trapped carriers dominate interfacial charge transfer in this system.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 334: Symposium W – Gas-Phase and Surface Chemistry in Electronic Materials Processing , 1993 , 251
Copyright
Copyright © Materials Research Society 1994

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References

1. Stehlin, T., Feller, M., Guyot-Sionnest, P. and Shen, Y. R., Opt. Lett. 13, 389 (1988).Google Scholar
2. Bloembergen, N. and Pershan, P. S., Phys. Rev. 2, 606 (1962).Google Scholar
3. Shen, Y. R., Ann. Rev. Phys. Chem. 40,327 (1989).Google Scholar
4. Patel, C. K. N., Phys. Rev. Lett. 16, 613 (1966).Google Scholar
5. Bechtel, J. H., J. Appl. Phys. 46, 1586 (1975).Google Scholar
6. Budde, F., Heinz, T. F., Loy, M. M., Misewich, J. A., Rougemont, F. de and Zacharias, H., Phys. Rev. Lett. 66, 3024 (1990).CrossRefGoogle Scholar
7. Evenor, M., Gottesfeld, S., Harzion, Z., Huppert, D. and Feldberg, S. W., J. Phys. Chem. 88, 6213 (1984).CrossRefGoogle Scholar
8. Orton, J. W. and Blood, P., The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Academic Press, 1990), p. 28.Google Scholar
9. Carslaw, H.S. and Jaeger, J. C., Conduction of Heat in Solids (Oxford University Press, 1990), p. 358.Google Scholar