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Phototransport Properties of a-SiC:H Alloys

Published online by Cambridge University Press:  15 February 2011

G. Nery
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras, PR 00931
A. Ramirez
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras, PR 00931
O. Resto
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras, PR 00931
S. Z. Weisz
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras, PR 00931
Y. Lubianiker
Affiliation:
Racah Institute of Physics, The Hebrew University, Jerusalem 91904, Israel
I. Balberg
Affiliation:
Racah Institute of Physics, The Hebrew University, Jerusalem 91904, Israel
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Abstract

We report a study of the mobility-lifetime products of the two charge carriers in a-SiC:H alloys. The measurements were carried out as a function of the carbon concentration and the temperature. An analysis, relying on the interpretation of the corresponding light intensity exponents, indicates that neutral dangling bonds control the electrons' lifetime while another recombination center controls the holes' lifetime.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Li, Y-M., Mater. Res. Soc. Symp. Proc. 297, 803 (1993).Google Scholar
2. Zhu, Q. et al., Mater. Res. Soc. Symp. Proc. 336, 843 (1994).Google Scholar
3. de Cesare, G. et al., Mater. Res. Soc. Symp. Proc. 336, 885 (1994).Google Scholar
4. Moreli, G. et al., Mater. Res. Soc. Symp. Proc. 336, 607 (1994).Google Scholar
5. Galloni, R. et al., Mater. Res. Soc. Symp. Proc. 336, 517 (1994).Google Scholar
6. Salomon, I. and Tessler, L.R., Mater. Res. Soc. Symp. Proc. 336, 505 (1994).Google Scholar
7. Baker, S.H., Spear, W.E. and Gison, R.A.G., Phil. Mag. B 62, 213 (1990).Google Scholar
8. Tsutsumi, Y. et al., Mater. Res. Soc. Symp. Proc. 336, 343 (1994).Google Scholar
9. Mahan, A.H. et al., Mater. Res. Soc. Symp. Proc. 95, 361 (1987).Google Scholar
10. Smith, Z.E. et al., J. Non Cryst. Solids 114, 480 (1989).Google Scholar
11. Crovini, G., Mater. Res. Soc. Symp. Proc. 336, 481 (1994).Google Scholar
12. Gaughan, K., Viner, J. M. and Taylor, P.C., Mater. Res. Soc. Symp. Proc. 336, 553 (1994).Google Scholar
13. For a review of this technique, see Balberg, I., Mater. Res. Soc. Symp. Proc. 258, 693 (1992).Google Scholar
14. Weinert, H. et al., Mater. Res. Soc. Symp. Proc. 336, 497 (1993).Google Scholar
15. Conte, G. et al., Mater. Res. Soc. Symp. Proc. 297, 485 (1993).Google Scholar
16. Li, Y-M., Catalano, A. and Fieselmann, B.F., Mater. Res. Soc. Symp. Proc. 258, 923 (1992).Google Scholar
17. Mohring, H.-D., Abel, C-D., Bruggemann, R. and Bauer, G.H., J. Non Cryst. Solids 137&138, 847 (1991.Google Scholar
18. Mohring, H.-D., Schumm, G. and Bauer, G.H., Proc. of the XXIInd. IEEE PVSC (IEEE, New York, 1991), p. 1357.Google Scholar
19. Balberg, I. and Lubianiker, Y., Phys. Rev. B 48, 8709 (1993).Google Scholar
20. Morgado, E., J. Non Cryst. Solids 164–166, 627 (1993).Google Scholar
21. Balberg, I., J. Appl. Phys. 75, 914 (1994).Google Scholar
22. Shimizu, T. et al., Mater. Res. Soc. Symp. Proc. 118, 665 (1988).Google Scholar
23. Scholz, A. et al., J. Non Cryst. Solids 164–166, 375 (1993).Google Scholar
24. Demichelis, F. et al., Mater. Res. Soc. Symp. Proc. 297, 681 (1993).Google Scholar
25. Yang, L. et al., Mater. Res. Soc. Symp. Proc. 192, 243 (1990).Google Scholar
26. Balberg, I. and Weisz, S.Z., Appl. Phys. Lett. 59, 1726 (1991).Google Scholar
27. Morgado, E., Mater. Res. Soc. Symp. Proc. 336, 419 (1994).Google Scholar
28. Landsberg, P.T. and Browne, D.C., Proc. of the XIXth IEEE PVSC (IEEE, New York, 1987), p. 813.Google Scholar
29. Balberg, I., Biton, G. and Fonseca, L., unpublished.Google Scholar