Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T15:49:23.986Z Has data issue: false hasContentIssue false
  • English
  • Français

Photo-oxidation of Single-walled Carbon Nanotubes

Published online by Cambridge University Press:  26 February 2011

B Parekh ,
Thomas Debies ,
Chris Evans ,
Brian Landi ,
Ryne Raffaelle  and
Gerald Takacs
B Parekh
Affiliation:
[email protected], RIT, Chemistry and Center for Materials Science and Engineering, United States
Thomas Debies
Affiliation:
[email protected], Xerox, United States
Chris Evans
Affiliation:
[email protected], RIT, NanoPower Research Laboratories, United States
Brian Landi
Affiliation:
[email protected], RIT, NanoPower Research Laboratories, United States
Ryne Raffaelle
Affiliation:
[email protected], RIT, NanoPower Research Laboratories, United States
Gerald Takacs
Affiliation:
[email protected], RIT, Chemistry and Center for Materials Science and Engineering, United States
Get access

Abstract

UV- and vacuum UV-assisted photo-oxidation of single-walled carbon nanotube (SWNT) paper occurred with: (1) atmospheric oxygen pressure using low-pressure Hg lamps (λ = 253.7 and 184.9 nm), (2) low oxygen pressure employing emission downstream from an Ar microwave plasma (λ = 106.7 and 104.8 nm), and (3) high pressures of He in a rotating d.c. arc that was designed to produce a spectral continuum from He excimers (λ = 58 - 110 nm). The photo-oxidized materials were characterized by x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and Raman spectroscopy. UV photo-oxidation was demonstrated to be a controlled dry procedure for introducing oxygenated functional groups (C-O-C, C=O, O-C=O and O=C-O-C=O) on SWNTs.

Keywords

oxidationnanostructurephotochemical
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 887: Symposium Q – Degradation Processes in Nanostructured Materials , 2005 , 0887-Q01-07
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ebbesen, T., Hiura, H., Fujita, H. and Tanigaki, K., Nature 367, 519 (1994).Google Scholar
2. Hiura, H., Ebbesen, T. W. and Tanigaki, K., Adv. Mater. 7, 275 (1995).Google Scholar
3. Xing, Y., Liang, L., Chusuei, C. C. and Hull, R. V., Langmuir 21, 4185 (2005).Google Scholar
4. Banerjee, S. and Wong, S. S., J. Phys. Chem. B 106, 12144 (2002).Google Scholar
5. Lu, X., Zhang, L., Xu, X., Wang, N. and Zhang, Q., J. Phys. Chem. B 106, 2136 (2002).Google Scholar
6. Byl, O., Liu, J. and Yates, J. T. Jr, Langmuir 21, 4200 (2005).Google Scholar
7. Mawhinney, D. B., Naumenko, V., Kuznetsova, A., Yates, J. T. Jr, Liu, J. and Smalley, R. E., Chem. Phys. Lett. 324, 213 (2000).Google Scholar
8. Mawhinney, D. B., Naumenko, V., Kuznetsova, A., Yates, J. T. Jr, Liu, J. and Smalley, R. E., J. Am. Chem, Soc. 122, 2383 (2000).Google Scholar
9. Cai, L., Bahr, J. L., Yao, Y. and Tour, J. M., Chem. Mater. 14, 4235 (2002).Google Scholar
10. Parekh, B., Debies, T., Knight, P., Santhanam, K. S. V. and Takacs, G. A., Mat. Res. Soc. Sym. Proc. (Degradation Processes in Nanostructured Materials) 2005 MRS Fall Meeting, this issue (2006).Google Scholar
11. Landi, B. J., Raffaelle, R. R., Castro, S. L. and Bailey, S. G., Prog. Photovolt: Res. Appl. 13, 165 (2005).Google Scholar
12. Sener, U., Entenberg, A., Kahn, B., Egitto, F. D., Matienzo, L. J., Debies, T. and Takacs, G. A., in: Polyimides and Other High Temperature Polymers: Synthesis, Characterization and Applications, Mittal, K. L. (Ed.), Vol. 3, 535 – 552, VSP, Utrecht (2005).Google Scholar
13. Dasilva, W., Entenberg, A., Kahn, B., Debies, T. and Takacs, G. A., Mater. Res. Soc. Symp. Proc. 851 (Materials for Space Applications), 407 – 412 (2005); J. Adhesion Sci. Technol. 18, 1465 – 1481 (2004).Google Scholar
14. Takacs, G. A., Vukanovic, V., Egitto, F., Matienzo, L. J., Emmi, F., Tracy, D. and Chen, J. X., 10th IUPAC International Symp. on Plasma Chemistry (ISPC-10), Bochum, Germany, 1.4–29, p. 1–6 (1991);Google Scholar
Takacs, G. A., Vukanovic, V., Tracy, D., Chen, J. X., Egitto, F. D., Matienzo, L. J. and Emmi, F., Poly. Degrad. Stabil. 40, 73 (1993).Google Scholar
15. Chen, J. X., Tracy, D., Zheng, S., Xiaolu, L., Brown, S., VanDerveer, W., Entenberg, A., Vukanovic, V., Takacs, G. A., Egitto, F. D., Matienzo, L. J. and Emmi, F., Poly. Degrad. Stabil. 79, 399 (2003).Google Scholar
16. Zheng, S., Entenberg, A., Takacs, G. A., Egitto, F. D. and Matienzo, L. J., J. Adhesion Sci. Technol. 17, 1741 (2003).Google Scholar
17. Banerjee, S. and Wong, S. S., J. Am. Chem. Soc., 125, 10342 (2003).Google Scholar
18. Beamson, G. and Briggs, D., High Resolution XPS of Organic Polymers, John Wiley & Sons Ltd., Chichester, West Sussex, England, p.158 (1992).Google Scholar
19. Jorio, A., Pimenta, M. A., Souza Filho, A. G., Saito, R., Dresselhaus, G. and Dresselhaus, M. S., New Journal of Physics 5, 139.1 (2003).Google Scholar