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Photonic Crystal Templates Obtained by Two-Photon Laser Lithography in Photoresist SU-8

Published online by Cambridge University Press:  01 February 2011

Vygantas Mizeikis
Affiliation:
Core Research for Evolutionary Science and Technology - Japan Science and Technology Corporation, Research Institute for Electronic Science, Hokkaido University, CRIS building, N21 W10 Kita-ku Sapporo 001–0021, Japan
Kock Khuen Seet
Affiliation:
Core Research for Evolutionary Science and Technology - Japan Science and Technology Corporation, Research Institute for Electronic Science, Hokkaido University, CRIS building, N21 W10 Kita-ku Sapporo 001–0021, Japan
Saulius Juodkazis
Affiliation:
Core Research for Evolutionary Science and Technology - Japan Science and Technology Corporation, Research Institute for Electronic Science, Hokkaido University, CRIS building, N21 W10 Kita-ku Sapporo 001–0021, Japan
Vygandas Jarutis
Affiliation:
Core Research for Evolutionary Science and Technology - Japan Science and Technology Corporation, Research Institute for Electronic Science, Hokkaido University, CRIS building, N21 W10 Kita-ku Sapporo 001–0021, Japan
Hiroaki Misawa
Affiliation:
Core Research for Evolutionary Science and Technology - Japan Science and Technology Corporation, Research Institute for Electronic Science, Hokkaido University, CRIS building, N21 W10 Kita-ku Sapporo 001–0021, Japan
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Abstract

High quality templates of three-dimensional photonic crystals were fabricated in photoresist SU-8 using femtosecond laser lithography. The templates have woodpile and spiral architectures, which are widely expected to yield spectrally wide and robust photonic band gaps. Their optical characterization reveals fundamental and higher-order photonic stop-gaps in the infrared wavelength range of 2.0–8.0 μm. These templates are mechanically stable, nearly free of shrinkage-related deformations, and can be used for subsequent infiltration by optically active or high refractive index materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Yablonovitch, E., Phys. Rev. Lett. 58, 2059 (1987).Google Scholar
2. John, S., Phys. Rev. Lett. 87, 2486 (1987).Google Scholar
3. Noda, S., Physica B 279, 142 (2000).Google Scholar
4. Pusley, P. N., van Megen, W., Nature 320, 340 (1986).Google Scholar
5. Miguez, H., Lopez, C., Meseguer, F., Blanco, A., Vasquez, L., Mayoral, R., Appl. Phys. Lett. 71, 1148 (1996).Google Scholar
6. Miguez, H., Blanco, A., Meseguer, F., Lopez, C., Yates, H. M., Pemble, M. E., Fornes, V., Mifsud, A., Phys. Rev. B 59, 1563 (1999).Google Scholar
7. Blanco, A., Chomski, E., Grabtchak, S., Ibisate, M., John, S., Leonard, S., Lopez, C., Mesguer, F., Miguez, H., Mondia, J., Ozin, G.A, Toader, O., van Driel, H.M, Nature 405, 437 (2000).Google Scholar
8. Ho, K., Chan, C., Sokoulis, C., Biswas, R., Sigalas, M., Solid State Commun. 89, 413 (1994).Google Scholar
9. Toader, O., John, S., Science 292, 1133 (2001).Google Scholar
11. Johnson, S. G., Joannopoulos, J. D., Optics Express 8, 173 (2001).Google Scholar
12. Pendry, J., MacKinnon, A., Phys. Rev. Lett. 69, 2772 (1992).Google Scholar
13. Witzgall, G., Vrijen, R., Yablonovitch, E., Doan, V., Schwartz, B., Opt. Lett. 22, 1745 (1998).Google Scholar
14. Noda, S., Physica B 279, 142 (2000).Google Scholar
15. Kennedy, S. R., Brett, M. J., Toader, O., John, S., Nano Lett. 2, 59 (2002).Google Scholar
16. Toader, O., John, S., Phys. Rev. E 66, 16610 (2002).Google Scholar
17. Mizeikis, V., Seet, K.K., Juodkazis, S., Misawa, H., Opt. Lett. 29, 2061 (2004).Google Scholar
18. Seet, K.K., Mizekis, V., Juodkazis, S., Misawa, H., to be published (2005).Google Scholar
19. Straub, M., Ventura, M., Gu, M., Phys. Rev. Lett. 91, 43901 (2003).Google Scholar
20. Deubel, M., von Freymann, G., Wegener, M., Pereira, S., Busch, K., Soukoulis, C.M., Nature Materials 3, 444 (2004).Google Scholar