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Photoluminescence from Porous Silicon Anodized with Monochromatic Light Illumination

Published online by Cambridge University Press:  15 February 2011

Takahiro Matsumoto
Affiliation:
Single Quantum Dot Project, EFLATO, Japan Science and Technology Corporation, 5–9–9 Tokodai, Tsukuba 300–26, Japan, [email protected]
Yasuaki Masumoto
Affiliation:
Single Quantum Dot Project, EFLATO, Japan Science and Technology Corporation, 5–9–9 Tokodai, Tsukuba 300–26, Japan, [email protected]
Go Arata
Affiliation:
Institute of Physics, University of Tsukuba, Ibaraki 305, Japan
Hidenori Mimura
Affiliation:
Research Institute of Electrical Communication, Tohoku University, Sendai 980–77, Japan
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Abstract

The effect of monochromatic light during the anodization of porous silicon is investigated from the points of view of structural characterization and photoluminescence. A clear correlation is observed between the photoluminescence peak energy and the bandgap energy determined by the illuminating photon energy. The difference of these two energies is analyzed by a size-dependent Stokes shift.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

[1]Canham, L.T., Appl. Phys. Lett. 57, 1046 (1990).Google Scholar
[2]Lehmann, V., J. Electrochem. Soc. 140, 2836 (1993).Google Scholar
[3]Lehmann, V., Jobst, B., Muschik, T., Kux, A., and Petrova-Koch, V., Jpn. J. Appl. Phys. 32, 2095 (1993).Google Scholar
[4]Richter, H., Wang, Z.P., and Ley, L., Solid. State Commun. 39, 625 (1981).Google Scholar
[5]Campbell, I.H. and Fauchet, P.M., 58, 739 (1984).Google Scholar
[6]Kanemitsu, Y., Uto, H., Masumoto, Y., Futagi, T., Matsumoto, T., and Mimura, H., Phys. Rev. B 48, 2827 (1993).Google Scholar
[7]Sui, Z., Leong, P.P., Herman, I.P., Higashi, G.S., and Temkin, H., Appl. Phys. Lett. 60, 2086 (1992).Google Scholar
[8]Schuppler, S., Friedman, S.L., Marcus, M.A., Adler, D.L., Xie, Y.-H., Ross, F.M., Harris, T.D., Brown, W.L., Chabel, Y.J., Brus, L.E., and Citrin, P.H., Phys. Rev. Lett. 72, 2648 (1994).Google Scholar
[9]Matsumoto, T., Masumoto, Y., and Koshida, N., to be published.Google Scholar
[10]Schuppler, S., Friedman, S.L., Marcus, M.A., Adler, D.L., Xie, Y.-H., Ross, F.M., Harris, T.D., Brown, W.L., Brus, L.E., Brown, W.L., Chaban, E.E., Szajoski, P.F., Chrsistman, S.B., and Citrin, P.H., Phys. Rev. B 52, 4910 (1995).Google Scholar