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Photoinduced Temporal Change of Surface-Potential Undulation on Alq3 Thin Films Observed by Kelvin Probe Force Microscopy

Published online by Cambridge University Press:  04 February 2011

Kazunari Ozasa ,
Hiromi Ito ,
Mizuo Maeda  and
Masahiko Hara
Kazunari Ozasa
Affiliation:
Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
Hiromi Ito
Affiliation:
Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
Mizuo Maeda
Affiliation:
Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
Masahiko Hara
Affiliation:
Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Abstract

The surface potential (SP) undulation on the surfaces of tris(8-hydroxyquinolinato) aluminum (III) (Alq3) films has been investigated with Kelvin probe force microscopy (KFM) and scanning near-field optical microscope (SNOM)-KFM. The SP undulation observed on the amorphous Alq3 films with thicknesses of up to 300 nm showed a cloud-like morphology of 200–300 nm in lateral size. The temporal change of SP undulation was traced through cyclic measurement with KFM observation with intermittent photoexposure, as well as in situ localized photoexcitation with SNOM-KFM. We concluded that the origin of the SP undulation is the nonuniform distribution of charged traps and drift mobility in the Alq3 films.

Keywords

scanning probe microscopy (SPM)thin filmsemiconducting
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-vv06-11
Copyright
Copyright © Materials Research Society 2011

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References

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