Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-27T01:36:23.866Z Has data issue: false hasContentIssue false
  • English
  • Français

Photoelectron Angular Distributions Of Ultrathin NI/CU(001) Films

Published online by Cambridge University Press:  15 February 2011

G.J. Mankey ,
K. Subramanian ,
R.L. Stockbauer  and
R.L. Kurtz
G.J. Mankey
Affiliation:
Department of Physics and Astronomy. Louisiana State University, Baton Rouge. LA, 70803, [email protected]
K. Subramanian
Affiliation:
Department of Physics and Astronomy. Louisiana State University, Baton Rouge. LA, 70803, [email protected]
R.L. Stockbauer
Affiliation:
Department of Physics and Astronomy. Louisiana State University, Baton Rouge. LA, 70803, [email protected]
R.L. Kurtz
Affiliation:
Department of Physics and Astronomy. Louisiana State University, Baton Rouge. LA, 70803, [email protected]
Get access

Abstract

We present measurements of the evolution with film thickness of the 3d electronic states at the Fermi energy of ultrathin Ni films. The morphology and thickness of the films is determined from x-ray photoelectron spectroscopy. x-ray photoelectron diffraction and x-ray magnetic linear dichroism using synchrotron radiation. Photoelectron angular distributions were measured using an ellipsoidal mirror analyzer. Even at submonolayer Ni coverages, the 3d electronic states exhibit bulk-like properties. This is attributed to the short screening length of electrons in metals, the localization of the 3d electrons, the similarity of the Ni and Cu ion cores, and finally the interaction with the underlying fcc periodic potential.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 39
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Shen, J., Giergiel, J. and Kirschner, J., Phys. Rev. B 52, 8454 (1995).Google Scholar
2. Courths, R. and Hufner, S.. Phys. Rep. 112, 53 (1984).Google Scholar
3. Himpsel, F.J. and Ortega, J.E., Phys. Rev. B 46, 9719 (1992).Google Scholar
4. Eberhardt, W. and Plummer, E.W., Phys. Rev. B 21, 3245 (1980).Google Scholar
5. Mankey, G.J.. Willis, R.F. and Himpsel, F.J., Phys. Rev. B 48, 10284 (1993).Google Scholar
6. Qu, Z.. Subramanian, K., Mainkar, N., Goonewardene, A, Campbell, T., Kakar, S., Kurtz, R.L., Stockbauer, R.L.. Milhill, A. and Saile, V., Nucl. Instrum. Meth. Phys. Res. A 347, 299 (1994).Google Scholar
7. Kurtz, R.L.. Robey, S.W., Hudson, L.T., Smilgys, R.V. and Stockbauer, R.L., Nucl. Instrum. Meth. Phys. Res. A 319, 257 (1992).Google Scholar
8. Roth, Ch., Hillebracht, F.U.. Rose, H. and Kisker, E., Phys. Rev. Lett. 70, 3479 (1993).Google Scholar
9. Huang, F., Kief, M.T., Mankey, G.J. and Willis, R.F., Phys. Rev. B 49, 3962 (1994).Google Scholar