Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T10:59:54.584Z Has data issue: false hasContentIssue false
  • English
  • Français

Photoacoustic spectra from copper phthalocyanine films on Si wafers

Published online by Cambridge University Press:  21 March 2011

Masato Ohmukai ,
Hitoshi Kubota  and
Yasuo Tsutsumi
Masato Ohmukai
Affiliation:
Department of Electrical Engineering, Akashi College of Technology, Hyogo 674-8501, Japan
Hitoshi Kubota
Affiliation:
Department of Electrical Engineering, Akashi College of Technology, Hyogo 674-8501, Japan
Yasuo Tsutsumi
Affiliation:
Department of Electrical Engineering, Akashi College of Technology, Hyogo 674-8501, Japan
Get access

Abstract

Copper phthalocyanine (CuPc) films were deposited on (100) silicon wafers by means of a vacuum evaporation method. We examined the films using photoacoustic (PA) spectroscopy to study their optical absorption properties. It was clarified that the PA signal from the silicon substrate can be excluded with a chopping frequency of 200 Hz when the film thickness is greater than 4.4 m. We detected an absorption band at 1.128 eV.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 672: Symposium O – Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures , 2001 , O3.3
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Sheats, J. R., Antoniadis, H., Hueschen, M., Leonard, W., Miller, J., Moon, R., Roitman, D. and Stocking, A., Science 273, 884 (1996).Google Scholar
[2] Rothberg, L. J. and Lovinger, A. J., J. Mater. Res. 11, 3174 (1996).Google Scholar
[3] Yoshida, M., Fujii, A., Ohmori, Y. and Yoshino, K., Appl. Phys. Lett. 69, 734 (1996).Google Scholar
[4] Wu, C. C., Strum, J. C., Register, R. A. and Thompson, M. E., Appl. Phys. Lett. 69, 3117 (1996).Google Scholar
[5] Kalinowski, J., Marco, P. D., Cocchi, M., Fattori, V., Camaioni, N. and Duff, J., Appl. Phys. Lett. 68, 2317 (1996).Google Scholar
[6] “Phthalocyanine Research and Applications” ed. by Thomas, A. L., CRC Press, Boston, 1990.Google Scholar
[7] Burrows, P. E., Buloviü, V., Gu, G., Kozlov, V., Forrest, S. R. and Thompson, M. E., Thin Solid Films 331, 101 (1998).Google Scholar
[8] Kido, J., Iizumi, Y., Appl. Phys. Lett. 73, 2721 (1998).Google Scholar
[9] Li, X., Shen, S., Zhou, Q., Xu, H., Jiang, D. and Lu, A., Thin Solid Films 324, 274 (1998).Google Scholar
[10] Gu, C., Sun, L., Zhang, T., Li, T. and Zhang, X., Thin Solid Films 327–329, 383 (1998).Google Scholar
[11] Chen, Q., Gu, D. and Gan, F., Solid-State Electron. 37, 1768 (1994).Google Scholar
[12] Rosencwaig, A. and Gersho, A., J. Appl. Phys. 47, 64 (1976).Google Scholar
[13] Ambily, S. and Menon, C. S., Solid State Commun. 94, 485 (1995).Google Scholar