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Phase transitions of self-polarized PZT thin films

Published online by Cambridge University Press:  01 February 2011

Gunnar Suchaneck
Affiliation:
Dresden University of Technology, Institute for Solid State Electronics, D-01062 Dresden, Germany.
Gerald Gerlach
Affiliation:
Dresden University of Technology, Institute for Solid State Electronics, D-01062 Dresden, Germany.
Alexander Deyneka
Affiliation:
Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic.
Lubomir Jastrabik
Affiliation:
Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic.
Sulkhan T. Davitadze
Affiliation:
Moscow State University, 11119899, Moscow, Russia
Boris A. Strukov
Affiliation:
Moscow State University, 11119899, Moscow, Russia
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Abstract

Optical properties and thermal properties of self-polarized thin PZT films were determined by variable angle spectral ellipsometry and by the AC hot strip method, respectively. Analyzing the temperature dependencies of the optical gap and the specific heat, evidence of two not as yet observed phase transitions in the ferroelectric was provided. The origin of these phase transitions was attributed to film stress caused by substrate/PZT thin film lattice mismatch and to the presence of a negative space charge layer in the PZT film at the bottom electrode/PZT interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

]1] Strukov, B.A. and Levanyuk, A.P., Ferroelectric Phenomena in crystals: physical foundations (Springer-Verlag, Berlin-Heidelberg, 1998).Google Scholar
]2] Deineka, A., Jastrabik, L., Suchaneck, G., Gerlach, G., presented at 10th International Meeting on Ferroelectricity, September 3-7, 2001, Madrid (Spain), paper PS5B-32 (to be published in Ferroelectrics 2002).Google Scholar
]3] Vechten, J.A. van, in Handbook on Semiconductors, Vol. 3, edited by Keller, S.P. (North-Holland Publishing Co., Amsterdam, 1980), pp. 1111.Google Scholar
]4] Kravchun, S. N., Davitadze, S. T., Mizina, N. S., and Strukov, B. A., Fiz. Tverd. Tela 39, 762 (1997).]Phys. Solid State 39, 675 (1997)]Google Scholar
]5] Suchaneck, G., Lin, W.-M., Koehler, R., Sandner, T., Gerlach, G., Krawietz, R., Pompe, W., Deineka, A., Jastrabik, L., Vacuum (2002), (in print).Google Scholar
]6] Azzam, R. M. A. and Bashara, N. M., Ellipsometry and polarized light, (North- Holland, Amsterdam, 1977).Google Scholar
]7] Deineka, A., Glinchuk, M., Jastrabik, L., Suchaneck, G., Gerlach, G., phys. stat. sol. (a) 175, 443 (1999).Google Scholar
]8] Davitadze, S. T., Kravchun, S. N., Strukov, B. A., Goltzman, B. M., Lemanov, V. V., and Shulman, S. G., Appl. Phys. Letters, 80, 1631 (2002).Google Scholar
]9] Fridkin, V. M., Zh. Eksp. Teor. Fiz. Pisma 3, 252 (1996).Google Scholar
]10] Fridkin, V. M., Segnetoelektriki-Poluprovodniki (in Russian), (Nauka, Moscow, 1976) p.135.Google Scholar
]11] Prokopalo, O.I., Raevski, I.P., Malitskaya, M.A., YPopov, u.N., Bokov, A.A. and Smotrakov, V.G. Ferroelectrics 45, 89 (1982).Google Scholar
]12] Robertson, J., Warren, W.L. and Tuttle, B.A., J. Appl. Phys. 77, 3975 (1995).Google Scholar
]13] Cohen, R.E., Nature 358, 136 (1992).Google Scholar
]14] Landolt-Börnstein Tables, edited by Hellwege, K.-H. and Hellwege, A.M. (Springer Verlag, Berlin-Heidelberg, 1969).Google Scholar
]15] Park, C.H. and Chadi, D.J., Phys. Rev. B57, R13961 (1998).Google Scholar
]16] Kala, T., Phase transitions 36, 65 (1991).Google Scholar
]17] Bruchhaus, R., Pitzer, D., Primig, R., Wersing, W. and Xu, Y., Integrated Ferroelectrics 14, 141 (1997)Google Scholar
]18] Suchaneck, G., Koehler, R., Padmini, P., Sandner, T., Frey, J. and Gerlach, G., Surface and Coatings Technology 116-119, 1238 (1999).Google Scholar
]19] Rossetti, G.A. and Navrotsky, A., J. Solid State Chem. 144, 188 (1999).Google Scholar
]20] Pertsev, N.A., Zembilgotov, A.G. and Tagantsev, A.K., Phys. Rev. Lett. 80, 1988 (1998).Google Scholar
]21] Deineka, A., Jastrabik, L., Suchaneck, G., Gerlach, G., phys. stat. sol. (a) 188, 1549 (2001).Google Scholar
]22] Bratkovsky, A.M. and Levanyuk, A.P., Phys. Rev. B61, 15042 (2000).Google Scholar