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Phase Stability of Ni2Al3 under Electron Irradiation

Published online by Cambridge University Press:  25 February 2011

E. A. Kenik  and
M. Nastasi
E. A. Kenik
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376
M. Nastasi
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, P.O. Box 1663, Los Alamos, NM 87545
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Abstract

In-situ electron irradiations at 200, 300, and 1000 keV have been performed on Ni2Al3 at 100 and 300 K. At low doses, the Ni2Al3 partially disorders to a B2 structure with a lattice parameter of 0.284 nm, close to that extrapolated for β-NiAl at 60 at.% Al, the Ni2Al3 composition. The electron dose required to disorder the Ni2Al3 decreased with increasing accelerating voltage and possibly with decreasing temperature. At high doses, precipitation of aluminum from the B2 matrix occurs, along with radiation-induced sputtering and radiation-induced segregation. Lattice parameter changes for the B2 structure observed during irradiation are explained in terms of the compositional dependence of the lattice parameter of β-NiAl. The B2 structure remains stable to a dose of 6 × 1028 electrons/m2, with no amorphization detected.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 128: Symposium A – Processing and Characterization of Materials Using Ion Beams , 1988 , 333
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Brimhall, J. L., Kissinger, H. E., and Charlot, L. A., Radiation Effects, 77, 273 (1983).10.1080/00337578308228192Google Scholar
2. Howe, L. M. and Rainville, M. H., J. Nucl. Mater., 68, 215 (1977).10.1016/0022-3115(77)90241-0CrossRefGoogle Scholar
3. Wilkes, P., J. Nucl. Mater., 83, 166 (1979).10.1016/0022-3115(79)90602-0CrossRefGoogle Scholar
4. Nelson, R. S., Hudson, J. A., and Mazey, D. J., J. Nucl. Mater., 44, 318 (1972).10.1016/0022-3115(72)90043-8Google Scholar
5. Brimhall, J.L., Simonen, E.P., Nucl. Instr. Meth. Phys. Res., B16, 187 (1986).10.1016/0168-583X(86)90012-1Google Scholar
6. Gilbert, R. W., Griffiths, M., and Carpenter, G. J. C., J. Nucl. Mater., 135, 265 (1985).10.1016/0022-3115(85)90086-8Google Scholar
7. Lee, E. H. and Kenik, E. A., J. Mater. Res., 3, 840 (1988).10.1557/JMR.1988.0840Google Scholar
8. Nastasi, M., Hung, L.S., Johnson, H.H., and Mayer, J.W., J. Appl. Phys. 57, 1050 (1985).10.1063/1.334546CrossRefGoogle Scholar
9. Nastasi, M., Williams, J.M., Kenik, E.A., and Mayer, J.W., Nucl. Instr. Meth. Phys. Res. B19/20, 543 (1987).10.1016/S0168-583X(87)80108-8Google Scholar
10. Kenik, E. A. and Nastasi, M., in Proc. of 46th Electron Microscopy Society of America Meeting, edited G.W. Bailey (San Francisco Press, San Francisco, CA 1988) p. 560; Ultramicroscopy (In Press).Google Scholar
11. Bradley, A. J. and Taylor, A., Proc. Roy. Soc. London, 159, 54 (1937).Google Scholar
12. Pearson, W. B., Lattice Spacings and Structures of Metals and Alloys (Pergamon Press, New York, 1958) p. 39.Google Scholar
13. Picraux, S.T., Follstaedt, D.M., Knapp, J.A., Wampler, W.R., and Rimini, E., in Laser and Electron-Beam Solid Interactions and Materials Processing, edited by Gibbons, J.F., Hess, L.D., and Sigmon, T.W. (Mater. Res. Soc. Proc. 1, Pittsburgh, PA 1981) pp. 575–582.Google Scholar
14. Williams, R.K., Wiffen, F.W., Bentley, J., and Stiegler, J.O., Metall. Trans., 14A, 655 (1983).10.1007/BF02643781Google Scholar
15. Follstaedt, D.M. and Romig, A.D. Jr, in Microbeam Analysis -1985, edited by Armstrong, J.T. (San Francisco Press, San Francisco, CA 1985) pp. 173–178.Google Scholar
16. Bradley, C. R. and Zaluzec, N. J., in Analytical Electron Microscopy -1987, edited by Joy, D.C. (San Francisco Press, San Francisco, 1987) pp. 117–120.Google Scholar
17. Okamoto, P. R. and Lam, N. Q., in Advanced Photon and Particle Techniques for the Characterization of Defects in Solids, edited by Roberto, J.B., Carpenter, R.W., and Wittels, M.C. (Mater. Res. Soc. Proc. 41, Pittsburgh, 1985) pp. 241–246.Google Scholar